G01R 31/317
Testing of digital circuits
G01R31/317 (Testing of digital circuits) appears on 15,852 US grants and 12,684 published applications in this corpus.
Search patents in G01R- Granted patents
- 15,852
- Published applications
- 12,684
- Assignees
- 2,148
- Inventors
- 22,174
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 20 | 0 |
| 1977 | 22 | 0 |
| 1978 | 16 | 0 |
| 1979 | 14 | 0 |
| 1980 | 23 | 0 |
| 1981 | 25 | 0 |
| 1982 | 26 | 0 |
| 1983 | 21 | 0 |
| 1984 | 37 | 0 |
| 1985 | 73 | 0 |
| 1986 | 54 | 0 |
| 1987 | 106 | 0 |
| 1988 | 91 | 0 |
| 1989 | 119 | 0 |
| 1990 | 106 | 0 |
| 1991 | 103 | 0 |
| 1992 | 124 | 0 |
| 1993 | 119 | 0 |
| 1994 | 168 | 0 |
| 1995 | 216 | 0 |
| 1996 | 249 | 0 |
| 1997 | 263 | 0 |
| 1998 | 337 | 0 |
| 1999 | 347 | 0 |
| 2000 | 327 | 0 |
| 2001 | 357 | 112 |
| 2002 | 393 | 445 |
| 2003 | 481 | 547 |
| 2004 | 520 | 625 |
| 2005 | 462 | 743 |
| 2006 | 639 | 761 |
| 2007 | 696 | 817 |
| 2008 | 700 | 777 |
| 2009 | 698 | 696 |
| 2010 | 760 | 580 |
| 2011 | 670 | 490 |
| 2012 | 478 | 386 |
| 2013 | 521 | 452 |
| 2014 | 478 | 482 |
| 2015 | 463 | 477 |
| 2016 | 485 | 466 |
| 2017 | 465 | 412 |
| 2018 | 426 | 384 |
| 2019 | 449 | 418 |
| 2020 | 474 | 432 |
| 2021 | 441 | 428 |
| 2022 | 403 | 411 |
| 2023 | 449 | 380 |
| 2024 | 402 | 403 |
| 2025 | 343 | 331 |
| 2026 | 193 | 229 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01R 31/3181Functional testing12,294
- G01R 31/3177Testing of logic operation2,077
- G01R 31/31712Input or output aspects1,274
- G01R 31/31725Timing aspects1,157
- G01R 31/31727Clock circuits aspects1,026
- G01R 31/31723Hardware for routing the test signal within the device under test to787
- G01R 31/31708Analysis of signal quality752
- G01R 31/31701Arrangements for setting the unit under test [uut] in a test mode560
All 22 subgroupsShow fewer
- G01R 31/31724Test controller536
- G01R 31/31705Debugging aspects511
- G01R 31/31721Power aspects483
- G01R 31/31703Comparison aspects425
- G01R 31/31704Design for test310
- G01R 31/31718Logistic aspects276
- G01R 31/3172Optimisation aspects270
- G01R 31/31719Security aspects263
- G01R 31/31707Test strategies253
- G01R 31/31722Addressing or selecting of test units147
- G01R 31/31728Optical aspects95
- G01R 31/3173Marginal testing63
- G01R 31/31702Testing digital circuits including elements other than semiconductor transistors54
- G01R 31/31706Involving differential digital signals46
Recent patents
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- System and method for area-efficient monitoring of clock signals6 Oct 2026US 12,754,236 B2NXP B. V.
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- Semiconductor devices configured for repairing defective bumps8 Oct 2026US 2026/0309777 A1SK hynix Inc.
- Wrapper Cell Design and Built-In Self-Test Architecture for 3DIC Test and Diagnosis8 Oct 2026US 2026/0309778 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Test and/or measurement system8 Oct 2026US 2026/0309826 A1
- Jtag-based soc design verification on emulation1 Oct 2026US 2026/0299020 A1Microsoft Technology Licensing, LLC
- Multi-phase synchronized method for lane margining1 Oct 2026US 2026/0299021 A1SK hynix Inc.
Most cited
By later US patents
- User programmable integrated circuit interconnect architecture and test method471US 4,758,745 AActel Corporation · 1988
- Method and apparatus for providing attribute nodes in a graphical data flow environment448US 5,481,741 ANational Instruments Corporation · 1996
- Correlation of electrical test data with physical defect data433US 6,950,771 B1Xilinx, Inc. · 2005
- Source synchronous link integrity validation423US 6,965,648 B1Sun Microsystems, Inc. · 2005
- System and method for comparing values from target systems419US 6,578,058 B1Agilent Technologies, Inc. · 2003