G01R 31/31707
Test strategies
Official title: {Test strategies (methods for generation of test sequences G01R31/318371)}
G01R31/31707 (Test strategies) appears on 253 US grants and 250 published applications in this corpus.
Search patents in G01R- Granted patents
- 253
- Published applications
- 250
- Assignees
- 148
- Inventors
- 603
- Latest grant
- 4 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 2 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 3 | 0 |
| 1995 | 1 | 0 |
| 1996 | 2 | 0 |
| 1997 | 3 | 0 |
| 1998 | 0 | 0 |
| 1999 | 2 | 0 |
| 2000 | 2 | 0 |
| 2001 | 1 | 1 |
| 2002 | 6 | 3 |
| 2003 | 7 | 7 |
| 2004 | 8 | 18 |
| 2005 | 8 | 15 |
| 2006 | 7 | 12 |
| 2007 | 10 | 16 |
| 2008 | 12 | 16 |
| 2009 | 17 | 18 |
| 2010 | 24 | 6 |
| 2011 | 9 | 2 |
| 2012 | 3 | 0 |
| 2013 | 4 | 6 |
| 2014 | 5 | 6 |
| 2015 | 4 | 12 |
| 2016 | 8 | 8 |
| 2017 | 13 | 21 |
| 2018 | 8 | 12 |
| 2019 | 16 | 10 |
| 2020 | 12 | 8 |
| 2021 | 12 | 16 |
| 2022 | 9 | 9 |
| 2023 | 12 | 11 |
| 2024 | 10 | 8 |
| 2025 | 8 | 9 |
| 2026 | 2 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Flexible test instruction set architecture4 Aug 2026US 12,699,131 B2Signature IP Corporation
- Supply chain security for chiplets2 Jun 2026US 12,644,925 B2Advanced Micro Devices, Inc.
- Pattern generation system with pin function mapping23 Dec 2025US 12,504,470 B2Yangtze Memory Technologies Co., Ltd.
- Circuit, chip and semiconductor device14 Oct 2025US 12,445,135 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Systems and method to test semiconductor devices2 Sep 2025US 12,405,300 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Systems and method to test semiconductor devices23 Oct 2025US 2025/0327849 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Method of testing an integrated circuit and testing system23 Oct 2025US 2025/0327854 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Undefined State Signaling Injection for Cross Domain Verification2 Oct 2025US 2025/0306100 A1Google Inc.
- Test circuit and integrated circuit including the same14 Aug 2025US 2025/0258225 A1Samsung Electronics Co., Ltd.
- Method and device of manufacturing semiconductor device22 May 2025US 2025/0164556 A1Denso Corporation
Most cited
By later US patents
- Alternator/starter testing device209US 5,701,089 AAutoZone, Inc. · 1997
- System architecture for on-line machine diagnostics129US 6,041,287 AReliance Electric Industrial Company · 2000
- Integrated circuits having post-silicon adjustment control119US 6,957,163 B22005
- System and apparatus for using test structures inside of a chip during the fabrication of the chip108US 7,256,055 B2tau-Metrix, Inc. · 2007
- System and apparatus for using test structures inside of a chip during the fabrication of the chip92US 7,736,916 B2tau-Metrix, Inc. · 2010