Pattern generation system with pin function mapping

A test equipment comprising:

• a set of test channels coupled to a set of pins of a device under test (DUT);
• and
• a pattern generation system comprising:
• a memory configured to store a lookup table set, wherein the lookup table set comprises a mapping relationship between source patterns and the set of test channels, and is indexed based on a pin function index;
• and
• a processor coupled to the memory and configured to:
• generate the source patterns;
• execute a pin-mapping operation based on an instruction to obtain a set of source selection signals for the set of test channels based on the pin function index and the lookup table set;
• and
• select and output a source signal from the source patterns for each test channel based on a corresponding source selection signal for the respective test channel.

A method, comprising:

• generating, by a processor, source patterns;
• executing a pin-mapping operation to obtain a set of source selection signals for a set of test channels based on a lookup table set and a pin function index, wherein the lookup table set comprises a mapping relationship between the source patterns and the set of test channels, the lookup table set is indexed based on the pin function index;
• and
• selecting and outputting a source signal from the source patterns for each test channel based on a corresponding source selection signal for the respective test channel.