Flexible test instruction set architecture
AssigneeSignature IP Corporation
InventorsShivam Mehra, Parag Bhatt, Michael Loe Fernandez, Kishore Mishra, Purna Mohanty
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AssigneeSignature IP Corporation
InventorsShivam Mehra, Parag Bhatt, Michael Loe Fernandez, Kishore Mishra, Purna Mohanty
Estimating the term…
Techniques for the testing of devices are disclosed. A testing environment is accessed. The testing environment includes an instruction RAM, an instruction fetch and decode unit (FAD), a code exerciser, a command interface, and a trace RAM. A device under test (DUT) is accessible by the command interface. The testing environment includes a test instruction set architecture (TISA). A test sequence is programmed by a user. The test sequence includes one or more instructions from within the TISA. The test sequence is stored in the instruction RAM. A first instruction is fetched by the FAD. The fetching includes decoding the first instruction. The first instruction is translated by the code exerciser. The translating produces a first packetized communication, which is sent to the DUT. A first packetized response is received by the command interface from the DUT and is reported to the user.
A processor-implemented method for testing comprising:
A computer program product embodied in a non-transitory computer readable medium for instruction execution, the computer program product comprising code which causes one or more processors to perform operations of:
A computer system for instruction execution comprising:
Dependencies are inferred from the claim text.