G01R 31/28

Testing of electronic circuits

Official title: Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits G01R31/002;} testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers {or computer components} G06F11/00; checking static stores for correct operation G11C29/00 {; testing receivers or transmitters of transmission systems H04B17/00})

G01R31/28 (Testing of electronic circuits) appears on 31,970 US grants and 26,969 published applications in this corpus.

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Granted patents
31,970
Published applications
26,969
Assignees
4,929
Inventors
47,738
Latest grant
6 Oct 2026

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G01R 31/28: granted patents and published applications per publication year
YearGranted patentsPublished applications
1976540
1977620
1978480
1979420
1980510
1981510
1982580
1983510
1984990
19851250
19861230
19871950
19881850
19892500
19902010
19912340
19922700
19932490
19943220
19954380
19964940
19975090
19986490
19996930
20007460
2001798265
2002860854
2003887967
200410171102
20059311325
200611751386
200711741454
200811641426
200911521261
201012621099
20111087967
2012844840
2013898887
20149101017
20158811065
2016986958
20171046948
20189791005
201910891050
202010961108
202111121074
202210141000
202310171048
20249631021
2025868998
2026561844

By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.

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