G01R 31/28
Testing of electronic circuits
Official title: Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits G01R31/002;} testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers {or computer components} G06F11/00; checking static stores for correct operation G11C29/00 {; testing receivers or transmitters of transmission systems H04B17/00})
G01R31/28 (Testing of electronic circuits) appears on 31,970 US grants and 26,969 published applications in this corpus.
Search patents in G01R- Granted patents
- 31,970
- Published applications
- 26,969
- Assignees
- 4,929
- Inventors
- 47,738
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 54 | 0 |
| 1977 | 62 | 0 |
| 1978 | 48 | 0 |
| 1979 | 42 | 0 |
| 1980 | 51 | 0 |
| 1981 | 51 | 0 |
| 1982 | 58 | 0 |
| 1983 | 51 | 0 |
| 1984 | 99 | 0 |
| 1985 | 125 | 0 |
| 1986 | 123 | 0 |
| 1987 | 195 | 0 |
| 1988 | 185 | 0 |
| 1989 | 250 | 0 |
| 1990 | 201 | 0 |
| 1991 | 234 | 0 |
| 1992 | 270 | 0 |
| 1993 | 249 | 0 |
| 1994 | 322 | 0 |
| 1995 | 438 | 0 |
| 1996 | 494 | 0 |
| 1997 | 509 | 0 |
| 1998 | 649 | 0 |
| 1999 | 693 | 0 |
| 2000 | 746 | 0 |
| 2001 | 798 | 265 |
| 2002 | 860 | 854 |
| 2003 | 887 | 967 |
| 2004 | 1017 | 1102 |
| 2005 | 931 | 1325 |
| 2006 | 1175 | 1386 |
| 2007 | 1174 | 1454 |
| 2008 | 1164 | 1426 |
| 2009 | 1152 | 1261 |
| 2010 | 1262 | 1099 |
| 2011 | 1087 | 967 |
| 2012 | 844 | 840 |
| 2013 | 898 | 887 |
| 2014 | 910 | 1017 |
| 2015 | 881 | 1065 |
| 2016 | 986 | 958 |
| 2017 | 1046 | 948 |
| 2018 | 979 | 1005 |
| 2019 | 1089 | 1050 |
| 2020 | 1096 | 1108 |
| 2021 | 1112 | 1074 |
| 2022 | 1014 | 1000 |
| 2023 | 1017 | 1048 |
| 2024 | 963 | 1021 |
| 2025 | 868 | 998 |
| 2026 | 561 | 844 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01R 31/317Testing of digital circuits15,852
- G01R 31/2851Testing of integrated circuits [ic]10,039
- G01R 31/282Testing of electronic circuits specially adapted for particular applications not provided for3,190
- G01R 31/302Contactless testing2,794
- G01R 31/2832Specific tests of electronic circuits not provided for elsewhere2,298
- G01R 31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip2,014
- G01R 31/30Marginal testing1,834
- G01R 31/3167Testing of combined analog and digital circuits363
All 9 subgroupsShow fewer
Recent patents
- Method of manufacturing a redistribution layer, redistribution layer, integrated circuit and methods for electrically testing and protecting the integrated circuit6 Oct 2026US 12,753,493 B2STMicroelectronics S,r.l.
- Testing a circuit board6 Oct 2026US 12,754,230 B2Teradyne, Inc.
- Testing system for detecting a fault and a location of the fault6 Oct 2026US 12,754,231 B2KARLZ STORZ Imaging Inc.
- Self-test auto monitor ground fault circuit interrupter (GFCI) with power denial6 Oct 2026US 12,754,232 B2Hubbell Incorporated
- Device inspection apparatus and device inspection method6 Oct 2026US 12,754,233 B2Mitsubishi Electric Corporation
- Cantilever holder structure with attached electrical components for a cantilever-card assembly and methods of forming the same8 Oct 2026US 2026/0309748 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Probe8 Oct 2026US 2026/0309749 A1Kabushiki Kaisha Nihon Micronics
- Measurement application device and method8 Oct 2026US 2026/0309767 A1Rohde & Schwarz GmbH & Co.KG
- Method for predicting defect in semiconductor device8 Oct 2026US 2026/0309768 A1Samsung Electronics Co., Ltd.
- Probe station device8 Oct 2026US 2026/0309769 A1Korea Basic Science Institute
Most cited
By later US patents
- Testing of semiconductor chips with microbumps1,870US 9,372,206 B2Taiwan Semiconductor Manufacturing Company.Ltd · 2016
- Self-test and status reporting system for microcontroller-controlled devices1,247US 6,104,304 AConexant Systems, Inc. · 2000
- Method and apparatus for temperature control of a semiconductor electrical-test contractor assembly532US 6,091,062 AKinetrix, Inc. · 2000
- User programmable integrated circuit interconnect architecture and test method471US 4,758,745 AActel Corporation · 1988
- Sockets for electronic components and methods of connecting to electronic components453US 5,772,451 AForm Factor, Inc. · 1998