Cantilever holder structure with attached electrical components for a cantilever-card assembly and methods of forming the same

A test apparatus comprising a cantilever-card assembly, the cantilever-card assembly comprising:

• a probe card;
• a cantilever holder structure attached to a bottom of the probe card;
• cantilever probe needles having first end portions embedded within the cantilever holder structure and having second end portions vertically extending downward;
• at least one auxiliary circuit board that is attached to the cantilever holder structure;
• and
• electrical components attached to the at least one auxiliary circuit board.

A method manufacturing a test apparatus, comprising:

• attaching electrical components to at least one auxiliary circuit board;
• attaching first end portions of cantilever probe needles to first ends of the electrical components;
• forming a cantilever holder structure by molding a dielectric material such that cantilever probe needles extend through the cantilever holder structure;
• attaching the cantilever holder structure to a bottom of a probe card;
• and
• electrically connecting second ends of the electrical components to electrically conductive structures in the probe card using connection wires, whereby a cantilever-card assembly is formed.