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US 12,754,233 B2Granted
Device inspection apparatus and device inspection method
AssigneeMitsubishi Electric Corporation
InventorsTakayuki Onaka, Tetsuhiro Fukao
Life of this patent
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Abstract
A device inspection apparatus comprises: a plurality of probe heads; an inspection circuitry to measure inspection value data for each semiconductor device; a storage circuitry to store inspection result data including the inspection value data and a determination result on the semiconductor device; and an analysis circuitry to perform, by statistical processing based on a plurality of the inspection result data present for each inspection item and stored in the storage circuitry, an analysis to determine if there is a significant difference between a plurality of the inspection result data for each of the probe heads, and determines that a probe head concerned is abnormal if there is a significant difference.
Claims20
A device inspection apparatus for inspecting a plurality of semiconductor devices in parallel, the apparatus comprising:
- a housing in which the plurality of semiconductor devices are mounted;
- a plurality of probe heads having probes to be in contact with electrodes of each semiconductor device and used individually for each of the semiconductor devices;
- an inspection circuitry to measure inspection value data for each of the semiconductor devices by applying an electric signal for each of the plurality of semiconductor devices for the plurality of semiconductor devices;
- an inspection determination circuitry to determine whether the semiconductor devices are non-defective or defective on a basis of the inspection value data;
- a storage circuitry to store inspection result data including the inspection value data and the determination result on the semiconductor devices;
- an analysis circuitry to analyze whether or not there is a significant difference between a plurality of the inspection result data for each of the probe heads by statistical processing based on a plurality of the inspection result data present for each of inspection items and stored in the storage circuitry every time the inspection result data is stored in the storage circuitry and to determine that a probe head concerned is abnormal if there is a significant difference;
- and
- a warning circuitry to indicate a result of abnormality determination in the analysis circuitry that the probe head concerned is abnormal, wherein
- a plurality of the inspection result data that the analysis circuitry analyzes includes past inspection result data measured by the inspection circuitry before a present inspection date in a set period.
6 more elements
A device inspection apparatus for inspecting a semiconductor device, the apparatus comprising:
- a housing in which the semiconductor device is mounted;
- a probe head having probes to be in contact with electrodes of the semiconductor device;
- an inspection circuitry to measure inspection value data of the semiconductor device by applying an electric signal to the semiconductor device;
- an inspection determination circuitry to determine whether the semiconductor device is non-defective or defective on a basis of the inspection value data;
- a storage circuitry to store inspection result data including the inspection value data and the determination result on the semiconductor device;
- an analysis circuitry to analyze whether or not there is a significant difference between a plurality of the inspection result data by statistical processing based on a plurality of the inspection result data present for each of inspection items and stored in the storage circuitry every time the inspection result data is stored in the storage circuitry and to determine that the probe head is abnormal if there is a significant difference;
- and
- a warning circuitry to indicate a result of abnormality determination in the analysis circuitry that the probe head is abnormal, wherein
- a plurality of the inspection result data that the analysis circuitry analyzes includes past inspection result data measured by the inspection circuitry before a present inspection date in a set period.
6 more elements
A device inspection method for inspecting a plurality of semiconductor devices in parallel, the method comprising:
- an inspection procedure for measuring inspection value data for each of the semiconductor devices by using, for each of the semiconductor devices, probe heads having probes to be in contact with electrodes of each semiconductor device;
- an inspection determination procedure for determining whether the semiconductor devices are non-defective or defective on a basis of the inspection value data;
- a storage procedure for storing inspection result data including the inspection value data and the determination result on the semiconductor devices;
- an analysis procedure for performing statistical processing on a basis of a plurality of the inspection result data present for each of inspection items and stored by the storage procedure every time the inspection result data is stored in the storage procedure, analyzing whether or not there is a significant difference between a plurality of the inspection result data for each of the probe heads, and determining that a probe head concerned is abnormal if there is a significant difference;
- and
- a warning procedure for indicating a result of abnormality determination in the analysis procedure that the probe head concerned is abnormal, wherein
- a plurality of the inspection result data to be analyzed in the analysis procedure includes past inspection result data measured in the inspection procedure before a present inspection date in a set period.
4 more elements
A device inspection method for inspecting a semiconductor device, the method comprising:
- an inspection procedure for measuring inspection value data of the semiconductor device by using a probe head having probes to be in contact with electrodes of the semiconductor device;
- an inspection determination procedure for determining whether the semiconductor device is non-defective or defective on a basis of the inspection value data;
- a storage procedure for storing inspection result data including the inspection value data and the determination result on the semiconductor device;
- an analysis procedure for performing statistical processing on a basis of a plurality of the inspection result data present for each of inspection items and stored by the storage procedure every time the inspection result data is stored in the storage procedure, analyzing whether or not there is a significant difference between a plurality of the inspection result data, and determining that the probe head is abnormal if there is a significant difference;
- and
- a warning procedure for indicating a result of abnormality determination in the analysis procedure that the probe head is abnormal, wherein
- a plurality of the inspection result data to be analyzed in the analysis procedure includes past inspection result data measured in the inspection procedure before a present inspection date in a set period.
4 more elements
Dependencies are inferred from the claim text.