G01R 31/3167
Testing of combined analog and digital circuits
Official title: Testing of combined analog and digital circuits {(testing ADC's H03M1/1071)}
G01R31/3167 (Testing of combined analog and digital circuits) appears on 363 US grants and 273 published applications in this corpus.
Search patents in G01R- Granted patents
- 363
- Published applications
- 273
- Assignees
- 180
- Inventors
- 776
- Latest grant
- 30 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 0 | 0 |
| 1989 | 4 | 0 |
| 1990 | 2 | 0 |
| 1991 | 0 | 0 |
| 1992 | 3 | 0 |
| 1993 | 4 | 0 |
| 1994 | 4 | 0 |
| 1995 | 6 | 0 |
| 1996 | 13 | 0 |
| 1997 | 5 | 0 |
| 1998 | 18 | 0 |
| 1999 | 9 | 0 |
| 2000 | 6 | 0 |
| 2001 | 5 | 2 |
| 2002 | 11 | 13 |
| 2003 | 16 | 19 |
| 2004 | 14 | 15 |
| 2005 | 21 | 25 |
| 2006 | 17 | 27 |
| 2007 | 22 | 17 |
| 2008 | 21 | 13 |
| 2009 | 12 | 13 |
| 2010 | 17 | 6 |
| 2011 | 6 | 7 |
| 2012 | 7 | 6 |
| 2013 | 3 | 5 |
| 2014 | 6 | 3 |
| 2015 | 4 | 4 |
| 2016 | 10 | 5 |
| 2017 | 6 | 7 |
| 2018 | 7 | 9 |
| 2019 | 10 | 7 |
| 2020 | 13 | 11 |
| 2021 | 6 | 12 |
| 2022 | 7 | 13 |
| 2023 | 14 | 9 |
| 2024 | 16 | 13 |
| 2025 | 10 | 6 |
| 2026 | 5 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Phase-shifter functional safety testing30 Jun 2026US 12,669,540 B2AyDeeKay LLC
- Test system for detecting faults in multiple devices of the same type5 May 2026US 12,618,895 B2NXP B. V.
- Signal processing method and measurement system3 Feb 2026US 12,540,970 B2Rohde & Schwarz GmbH & Co.KG
- Tool for electronics testing and diagnostics27 Jan 2026US 12,535,505 B2Gentiam LLC
- Spur detection in a sampled waveform in a mixed analog/digital system using the phase of the frequency response13 Jan 2026US 12,523,680 B2International Business Machines Corporation
- Test and/or measurement system8 Oct 2026US 2026/0309826 A1
- Phase-Shifter Functional Safety Testing24 Sep 2026US 2026/0287652 A1AyDeeKay LLC dba Indie Semiconductor
- Scan-based test circuitry for structural testing of analog and mixed-signal circuits10 Sep 2026US 2026/0266900 A1Siemens Industry Software Inc.
- Test and/or measurement system for testing a device-under-test28 May 2026US 2026/0147036 A1Rohde & Schwarz GmbH & Co.KG
- Machine Learning for Syncing Multiple FPGA Ports in a Quantum System30 Apr 2026US 2026/0118419 A1Quantum Machines
Most cited
By later US patents
- Method, apparatus and computer program product for determination of noise in mixed signal systems229US 6,941,258 B2Interuniversitair Microelektronica Centrum · 2005
- Non-volatile memory with analog and digital interface and storage93US 5,745,409 AInvox Technology · 1998
- Accurate alignment of clocks in mixed-signal tester92US 5,654,657 ASchlumberger Technologies, Inc. · 1997
- Mixed signal integrated circuit architecture and test methodology87US 5,481,471 AHughes Aircraft Company · 1996
- Digital testing of analog memory devices86US 5,682,352 AinVoice Technology, Inc. · 1997