Scan-based test circuitry for structural testing of analog and mixed-signal circuits

Abstract

A test circuit configured to test a circuit being at least partially analog, comprising: one or more scan chains and one or more threshold-comparing convertors. Each of the one or more thresholdcomparing convertors, comprising one or more threshold-comparing sub-convertors for one or more preset thresholds, is coupled to a selected node of the circuit, and wherein each of the one or more threshold-comparing sub-convertors is configured to output, based on comparing a voltage value at the selected node with one of the one or more preset thresholds, a bit value of the test response to a scan cell of the one or more scan chains. The test circuit may further comprise one or more node-connecting devices with inputs coupled to the one or more scan chains and with outputs coupled to one or more selected internal nodes of the circuit.

Dependencies are inferred from the claim text.