Test and/or measurement system

A test and/or measurement system for performing tests and/or measurements on a device under test,

• wherein the test and/or measurement system comprises a signal parameter circuit which is set up to provide at least one digital signal parameter, wherein the at least one digital signal parameter comprises a frequency of an analog test signal to be generated,
• wherein the test and/or measurement system comprises a signal generator circuit connected to the signal parameter circuit, wherein the signal generator circuit is set up to generate the analog test signal based on the at least one digital signal parameter,
• wherein the test and/or measurement system has at least one first port, wherein the first port is connected to the signal generator circuit, wherein the first port is adapted to be connected to the device under test,
• wherein the test and/or measurement system comprises a first coupling circuit arranged between the signal generator circuit and the first port,
• wherein the test and/or measurement system comprises a first measurement circuit, wherein the first measurement circuit is connected to the first coupling circuit, wherein the first measurement circuit has a first analog-to-digital converter, and wherein the first measurement circuit is set up to evaluate a portion of the analog test signal and a first measurement signal received via the first port,
• wherein the signal parameter circuit is set up to successively adjust the frequency of the analog test signal across a first frequency band by the at least one generated digital signal parameter, so that the analog test signal has a frequency sweep across the first frequency band, and
• wherein the first measurement circuit is set up to evaluate the portion of the analog test signal and the first measurement signal received via the first port during the frequency sweep across the first frequency band with an unchanging first frequency conversion.