Test and/or measurement system for testing a device-under-test

Abstract

The present disclosure relates to a test and/or measurement system for testing a DUT. The test and/or measurement system comprises a first port and a second port, wherein the DUT is connectable between the first and the second port; a signal generator which is configured to generate a digital test signal; a DAC which is configured to convert the digital test signal to an analog test signal; wherein the first port is configured to forward the analog test signal to the DUT, and wherein the second port is configured to receive an analog response signal from the DUT; an ADC which is configured to convert the analog response signal to a digital response signal; and a measurement device which is configured to compare the digital response signal to the digital test signal or to information about the digital test signal; wherein the measurement device is configured to trigger an adaption of an amplitude of the digital test signal based on a result of said comparison.

Dependencies are inferred from the claim text.