Phase-Shifter Functional Safety Testing
AssigneeAyDeeKay LLC dba Indie Semiconductor
InventorsTom Heller, Danny Elad, Benny Sheinman, Oded Katz
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AssigneeAyDeeKay LLC dba Indie Semiconductor
InventorsTom Heller, Danny Elad, Benny Sheinman, Oded Katz
Estimating the term…
An integrated circuit that performs testing of a circuit sub-block is described. This integrated circuit may include the circuit sub-block that performs a function, where the circuit sub-block is implemented in an analog domain using analog components and in a digital domain using digital components. Moreover, the integrated circuit may perform the testing of the circuit sub-block using independent testing of individual components in the circuit sub-block instead of testing the function of the circuit sub-block as a whole. Note that the individual components include the analog components and the digital components. In some embodiments, the testing may include functional safety testing.
An integrated circuit, comprising:
An electronic device, comprising:
A method for performing testing of a circuit sub-block, comprising:
Dependencies are inferred from the claim text.