G01R 31/00

Arrangements for testing electric properties

Official title: Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ({measuring superconductive properties G01R33/1238;} testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture {H10P74/00})

G01R31/00 (Arrangements for testing electric properties) appears on 58,139 US grants and 55,808 published applications in this corpus.

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Granted patents
58,139
Published applications
55,808
Assignees
10,781
Inventors
96,753
Latest grant
6 Oct 2026

Filings by year

G01R 31/00: granted patents and published applications per publication year
YearGranted patentsPublished applications
19761720
19771740
19781490
19791440
19801580
19811490
19821740
19831580
19842090
19852310
19862160
19873190
19883070
19894420
19903510
19913710
19924290
19933830
19944700
19956690
19967510
19977690
19989300
19999110
200010510
20011151348
200212251115
200311971271
200413051480
200512271728
200615121807
200714661877
200814531899
200915021866
201016531750
201115021730
201213821758
201315442054
201416362299
201517892550
201621342408
201724032323
201822522484
201926222667
202025992796
202126612801
202225952887
202324803072
202425193134
202524863124
202617572580

By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.

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