G01R 31/003
Environmental or reliability tests
Official title: {Environmental or reliability tests (of individual semiconductors G01R31/2642; of PCB's G01R31/2817; of IC's G01R31/2855; of other circuits G01R31/2849)}
G01R31/003 (Environmental or reliability tests) appears on 129 US grants and 149 published applications in this corpus.
Search patents in G01R- Granted patents
- 129
- Published applications
- 149
- Assignees
- 127
- Inventors
- 423
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 1 |
| 2004 | 0 | 0 |
| 2005 | 1 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 2 | 1 |
| 2011 | 0 | 0 |
| 2012 | 2 | 2 |
| 2013 | 4 | 8 |
| 2014 | 4 | 8 |
| 2015 | 3 | 8 |
| 2016 | 7 | 15 |
| 2017 | 9 | 14 |
| 2018 | 15 | 17 |
| 2019 | 8 | 7 |
| 2020 | 13 | 14 |
| 2021 | 10 | 13 |
| 2022 | 14 | 10 |
| 2023 | 10 | 7 |
| 2024 | 14 | 14 |
| 2025 | 8 | 1 |
| 2026 | 4 | 7 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method and device for determining a semiconductor temperature of a semiconductor element, converter, electric axel drive, and motor vehicle15 Sep 2026US 12,736,416 B2ZF Friedrichshafen AG
- Positioning method and probe system for performing the same, method for operating probe system, and method for utilizing probe system to produce a tested semiconductor device1 Sep 2026US 12,724,042 B2Mpi Corporation
- Spare part system for maintaining availability of spare parts for an electric power supply system7 Apr 2026US 12,596,156 B2Nexans
- Highly accelerated stress test device and method for highly accelerated stress test24 Mar 2026US 12,584,850 B2Hirayama Manufacturing Corporation
- Power source emulator and method for testing switchgear25 Nov 2025US 12,483,009 B2ModularMC, LLC
- Method and system for thermal control of devices in an electronics tester17 Sep 2026US 2026/0276734 A1Aehr Test Systems
- Method and system for thermal control of devices in an electronics tester20 Aug 2026US 2026/0243849 A1Aehr Test Systems
- Method and system for triggering battery thermal runaway6 Aug 2026US 2026/0229622 A1Contemporary Amperex Technology Co., Limited
- System and method for determining cable operational quality based on environment where cable is located28 May 2026US 2026/0147062 A1Guangzhou Panyu Cable Group Co., Ltd.
- Method and system for analysing an equipment for current cycling test21 May 2026US 2026/0140157 A1L&T Technology Services Limited
Most cited
By later US patents
- Apparatus for testing electronic devices30US 8,506,335 B2AEHA Test Systems · 2013
- Apparatus for testing electronic devices26US 7,762,822 B2Aehr Test Systems · 2010
- Remaining lifetime estimating method, temperature detecting structure and electronic equipment24US 6,880,967 B2OMRON Corporation · 2005
- Apparatus for testing electronic devices24US 8,628,336 B2Aehr Test Systems · 2014
- Apparatus for testing electronic devices18US 9,316,683 B2Aehr Test Systems · 2016