Highly accelerated stress test device and method for highly accelerated stress test
AssigneeHirayama Manufacturing Corporation
InventorsAkira Sato, Shinichi Yumoto, Masahiro Uchita
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AssigneeHirayama Manufacturing Corporation
InventorsAkira Sato, Shinichi Yumoto, Masahiro Uchita
Estimating the term…
A highly accelerated stress test device includes: a first heater that heats a test space; a second heater that heats a steam generating space; a first sensor that measures a first temperature of the test space; a second sensor that measures a second temperature of the steam generating space; an item temperature sensor that is directly attached to a sample placed in the test space and that measures an item temperature of the sample; and a controller that prepares, as candidates for a test mode, a normal mode in which on-off control of each of the first and second heaters is carried out based on the first and second temperatures, and an item-temperature mode in which the on-off control is carried out based on the item and second temperatures, and carries out the on-off control according to the test mode that is set with a test condition of the sample.
A highly accelerated stress test device comprising:
A method for highly accelerated stress test using a highly accelerated stress test device comprising a test space where a sample is placed therein and a steam generating space that generates steam to be supplied to the test space, the method comprising:
Dependencies are inferred from the claim text.