Method and device for determining a semiconductor temperature of a semiconductor element, converter, electric axel drive, and motor vehicle
AssigneeZF Friedrichshafen AG
InventorsMichael Meiler, Johannes Hager
Life of this patent
Estimating the term…
Abstract
A method for determining a semiconductor temperature Tj of a semiconductor element of a semiconductor module comprises ascertaining an estimated value of the semiconductor temperature Tj using an optimizable model of a thermal behavior of the semiconductor module, reading a measured value of the semiconductor temperature Tj, optimizing the optimizable model using the measured value, providing the estimated value of the semiconductor temperature Tj, if the measured value is not available, and the measured value if the measured value is available for the point in time, and repeating the steps of the method for further points in time.
Claims16
A method for determining a semiconductor temperature Tj of a semiconductor element of a semiconductor module, wherein the semiconductor module comprises the semiconductor element and a cooler unit thermally coupled via a thermal path with the semiconductor element, the method comprising:
- ascertaining, with a microcontroller, an estimated value of the semiconductor temperature Tj for a point in time using an optimizable model of a thermal behavior of the semiconductor module;
- reading, with the microcontroller, a measured value of the semiconductor temperature Tj for the point in time via an interface in response to the measured value being available for the point in time, wherein the measured value represents a value detected directly or indirectly using a sensor unit;
- optimizing, with the microcontroller, the optimizable model using the measured value of the semiconductor temperature Tj for the point in time in response to the measured value being available for the point in time;
- providing, with the microcontroller, a value representing the semiconductor temperature Tj for the point in time using the estimated value of the semiconductor temperature Tj, in response to the measured value not being available for the point in time, and using the measured value of the semiconductor temperature Tj, in response to the measured value being available for the point in time;
- throttling, with the microprocessor, a drive power of an electronic machine when the estimated value of the semiconductor temperature Tj indicates overheating;
- calculating a cooler temperature value of a cooler temperature Th of the cooler unit for the point in time using the measured value of the semiconductor temperature Tj for the point in time;
- optimizing the optimizable model using the cooler temperature value;
- and
- repeating the method for further points in time following the point in time.
A method for determining a semiconductor temperature Tj of a semiconductor element of a semiconductor module, wherein the semiconductor module comprises the semiconductor element and a cooler unit thermally coupled via a thermal path with the semiconductor element, the method comprising:
- ascertaining, with a microcontroller, an estimated value of the semiconductor temperature Tj for a point in time using an optimizable model of a thermal behavior of the semiconductor module;
- reading, with the microcontroller, a measured value of the semiconductor temperature Tj for the point in time via an interface in response to the measured value being available for the point in time, wherein the measured value represents a value detected directly or indirectly using a sensor unit;
- optimizing, with the microcontroller, the optimizable model using the measured value of the semiconductor temperature Tj for the point in time in response to the measured value being available for the point in time;
- providing, with the microcontroller, a value representing the semiconductor temperature Tj for the point in time using the estimated value of the semiconductor temperature Tj, in response to the measured value not being available for the point in time, and using the measured value of the semiconductor temperature Tj, in response to the measured value being available for the point in time;
- throttling, with the microprocessor, a drive power of an electronic machine when the estimated value of the semiconductor temperature Tj indicates overheating;
- and
- repeating the method for further points in time following the point in time;
- wherein ascertaining the estimated value of the semiconductor temperature Tj comprises:
- ascertaining a flow rate value of a coolant of the cooler unit for the point in time using the optimizable model.
A device for determining a semiconductor temperature Tj of a semiconductor element of a semiconductor module, wherein the semiconductor module comprises the semiconductor element and a cooler unit thermally coupled with the semiconductor element via a thermal path, wherein the device is configured to:
- ascertain an estimated value of the semiconductor temperature Tj for a point in time using an optimizable model of a thermal behavior of the semiconductor module;
- read a measured value of the semiconductor temperature Tj for the point in time via an interface in response to the measured value being available for the point in time, wherein the measured value represents a value detected directly or indirectly using a sensor unit;
- optimize the optimizable model using the measured value of the semiconductor temperature Tj for the point in time in response to the measured value being available for the point in time;
- provide a value representing the semiconductor temperature Tj for the point in time using the estimated value of the semiconductor temperature Tj, in response to the measured value not being available for the point in time, and using the measured value of the semiconductor temperature Tj, in response to the measured value being available for the point in time;
- throttle a drive power of an electronic machine when the estimated value of the semiconductor temperature Tj indicates overheating;
- calculate a cooler temperature value of a cooler temperature Th of the cooler unit for the point in time using the measured value of the semiconductor temperature Tj for the point in time;
- optimize the optimizable model using the cooler temperature value;
- and
- repeat the process for further points in time following the point in time.
A non-transitory computer readable medium having stored thereon a computer program that, when executed by a computer, cause the computer to perform a method comprising:
- ascertaining an estimated value of a semiconductor temperature Tj for a point in time using an optimizable model of a thermal behavior of a semiconductor module;
- reading a measured value of the semiconductor temperature Tj for the point in time via an interface in response to the measured value being available for the point in time, wherein the measured value represents a value detected directly or indirectly using a sensor unit;
- optimizing the optimizable model using the measured value of the semiconductor temperature Tj for the point in time in response to the measured value being available for the point in time;
- providing a value representing the semiconductor temperature Tj for the point in time using the estimated value of the semiconductor temperature Tj, in response to the measured value not being available for the point in time, and using the measured value of the semiconductor temperature Tj, in response to the measured value being available for the point in time;
- throttling a drive power of an electronic machine when the estimated value of the semiconductor temperature Tj indicates overheating;
- calculating a cooler temperature value of a cooler temperature Th of the cooler unit for the point in time using the measured value of the semiconductor temperature Tj for the point in time;
- optimizing the optimizable model using the cooler temperature value;
- and
- repeating the method for further points in time following the point in time.
Dependencies are inferred from the claim text.