Remaining lifetime estimating method, temperature detecting structure and electronic equipment
AssigneeOMRON Corporation
InventorsMasashi Isozumi, Tsunetoshi Oba
Life of this patent
Estimating the term…
Abstract
A temperature of an electrolytic capacitor 24 incorporated in equipment is detected, a remaining lifetime in actual use is calculated based on a temperature-lifetime law, and the remaining lifetime is indicated. A thin film tape 23 is wound around a temperature sensor 22 for insulation, and the electrolytic capacitor 24 and the temperature sensor 22 are accommodated in a heat-shrinkable tube 25, the secondary temperature sensor 22 is brought into tight contact with the primary electrolytic capacitor 24.
Claims26
An estimating method of a remaining lifetime of a subject, comprising:
- calculating the remaining lifetime at a predetermined temperature in accordance with an arithmetic expression based on a temperature-lifetime law, and
- converting the calculated remaining lifetime into a remaining lifetime in actual use.
A structure for detecting a temperature of a capacitor wherein an insulating tape is wound around a temperature sensor which detects a temperature of said capacitor to bring said temperature sensor into tight contact with said capacitor.
An electronic equipment having a capacitor, comprising:
- a temperature sensor for detecting a temperature of said capacitor,
- calculating means for calculating a remaining lifetime of said capacitor using a detected temperature from said temperature sensor,
- converting means for converting the calculated remaining lifetime into a remaining lifetime in actual use, and
- informing means for informing of the calculated remaining lifetime, wherein
- said calculating means includes a calculating section for calculating the remaining lifetime at a predetermined temperature in accordance with an arithmetic expression based on a capacitor temperature-lifetime law.
An electronic equipment having capacitor, comprising:
- a temperature sensor for detecting a temperature of said capacitor,
- a circuit arrangement which calculates the remaining lifetime of said capacitor using a detected temperature from said temperature sensor,
- a circuit arrangement which converts the calculated remaining lifetime into a remaining lifetime in actual use, and
- a circuit arrangement which informs the calculated remaining lifetime, wherein
- said circuit arrangement which calculates the remaining life time includes a calculating section for calculating the remaining lifetime at a predetermined temperature in accordance with an arithmetic expression based on a capacitor temperature-lifetime law.
Dependencies are inferred from the claim text.