G01R 31/001

Measuring interference from external sources to, or emission from, the device under

Official title: {Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing (measuring electromagnetic fields G01R29/08; circuits for generating HV pulses in dielectric strength testing G01R31/14)}

G01R31/001 (Measuring interference from external sources to, or emission from, the device under) appears on 787 US grants and 787 published applications in this corpus.

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22 Sep 2026

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G01R 31/001: granted patents and published applications per publication year
YearGranted patentsPublished applications
197710
197810
197900
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198110
198200
198310
198410
198500
198600
198700
198840
198940
199040
199120
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199300
199470
199590
1996110
199760
1998100
1999140
2000180
2001163
20021917
20031515
2004107
20051015
20061323
20071120
20082020
20091729
20101336
20112518
20122128
20132247
20142251
20152846
20164525
20173637
20183635
20194460
20205742
20214143
20224346
20233738
20243729
20253245
20261912

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