G01R 31/26
Testing of individual semiconductor devices
Official title: Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment {H10P74/00})
G01R31/26 (Testing of individual semiconductor devices) appears on 4,073 US grants and 4,071 published applications in this corpus.
Search patents in G01R- Granted patents
- 4,073
- Published applications
- 4,071
- Assignees
- 1,497
- Inventors
- 8,675
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 12 | 0 |
| 1977 | 15 | 0 |
| 1978 | 13 | 0 |
| 1979 | 9 | 0 |
| 1980 | 20 | 0 |
| 1981 | 10 | 0 |
| 1982 | 12 | 0 |
| 1983 | 9 | 0 |
| 1984 | 16 | 0 |
| 1985 | 18 | 0 |
| 1986 | 17 | 0 |
| 1987 | 24 | 0 |
| 1988 | 20 | 0 |
| 1989 | 45 | 0 |
| 1990 | 28 | 0 |
| 1991 | 22 | 0 |
| 1992 | 17 | 0 |
| 1993 | 13 | 0 |
| 1994 | 11 | 0 |
| 1995 | 29 | 0 |
| 1996 | 38 | 0 |
| 1997 | 37 | 0 |
| 1998 | 39 | 0 |
| 1999 | 25 | 0 |
| 2000 | 49 | 0 |
| 2001 | 47 | 12 |
| 2002 | 55 | 50 |
| 2003 | 47 | 55 |
| 2004 | 55 | 52 |
| 2005 | 49 | 72 |
| 2006 | 80 | 74 |
| 2007 | 54 | 73 |
| 2008 | 71 | 70 |
| 2009 | 59 | 69 |
| 2010 | 65 | 77 |
| 2011 | 51 | 103 |
| 2012 | 61 | 124 |
| 2013 | 93 | 195 |
| 2014 | 122 | 239 |
| 2015 | 177 | 301 |
| 2016 | 244 | 202 |
| 2017 | 237 | 203 |
| 2018 | 240 | 235 |
| 2019 | 229 | 222 |
| 2020 | 234 | 248 |
| 2021 | 242 | 237 |
| 2022 | 210 | 261 |
| 2023 | 213 | 220 |
| 2024 | 232 | 276 |
| 2025 | 209 | 246 |
| 2026 | 149 | 155 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01R 31/2607Circuits therefor2,038
- G01R 31/2601Apparatus or methods therefor689
- G01R 31/265Contactless testing497
- G01R 31/27Testing of devices without physical removal from the circuit of which they407
- G01R 31/2642Testing semiconductor operation lifetime or reliability405
- G01R 31/2648Characterising semiconductor materials349
- G01R 31/2644Adaptations of individual semiconductor devices to facilitate the testing thereof159
- G01R 31/2646For measuring noise20
Recent patents
- Test tray for semiconductor devices and test apparatus using the same6 Oct 2026US 12,754,227 B2Ateco Inc.
- Semiconductor test apparatus6 Oct 2026US 12,754,228 B2Samsung Electronics Co., Ltd.
- System for sensing current through a pass FET6 Oct 2026US 12,754,229 B2Nexperia B. V.
- Low current leakage measurement on a high current unified static and dynamic characterization platform29 Sep 2026US 12,748,145 B2Keithley Instruments, LLC
- Display device and inspecting method thereof29 Sep 2026US 12,749,419 B2Samsung Display Co., Ltd.
- Cantilever holder structure with attached electrical components for a cantilever-card assembly and methods of forming the same8 Oct 2026US 2026/0309748 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Semiconductor device and method of monitoring process defects of semiconductor device8 Oct 2026US 2026/0314337 A1SK hynix Inc.
- System for determining transistor operating characteristics1 Oct 2026US 2026/0299002 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Machine and method for testing light-emitting substrate1 Oct 2026US 2026/0299003 A1Harvatek Corporation
- Semiconductor device defect and fault isolation1 Oct 2026US 2026/0299004 A1Intel Corporation
Most cited
By later US patents
- Testing of semiconductor chips with microbumps1,870US 9,372,206 B2Taiwan Semiconductor Manufacturing Company.Ltd · 2016
- Wafer-level burn-in and test278US 6,064,213 AFormFactor, Inc. · 2000
- Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis203US 5,493,236 AMitsubishi Denki Kabushiki Kaisha · 1996
- Method and apparatus for testing chemical and ionic sensors194US 4,864,229 AIntegrated Ionics, Inc. · 1989
- Compositions and methods for helper-free production of recombinant adeno-associated viruses184US 6,258,595 B1The Trustees of the University of Pennsylvania · 2001