Semiconductor test apparatus
AssigneesSamsung Electronics Co., Ltd., YC Corporation
InventorsChunghyun Kim, Changsuk Oh, Kiyoung Jeon, Jaewon Yoo, Myoungsuk Jang, Kwanghwa Lee, Seokjae Hong
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AssigneesSamsung Electronics Co., Ltd., YC Corporation
InventorsChunghyun Kim, Changsuk Oh, Kiyoung Jeon, Jaewon Yoo, Myoungsuk Jang, Kwanghwa Lee, Seokjae Hong
Estimating the term…
A semiconductor test apparatus includes a base plate, side supporters provided as three or more on a lower surface of the base plate, an elastic cylinder and a side stopper provided on a lower surface of each of the side supporters, a center stopper provided laterally apart from the side supporters on the lower surface of the base plate, a stopper foot provided at one end of the center stopper, a foot supporter provided at one end of the stopper foot, a top plate disposed under the base plate to contact the elastic cylinder and the side stopper, the top plate including a center hole in a center portion thereof, and a substrate cover provided under the top plate, wherein the center stopper and the side stopper are selectively locked.
A semiconductor test apparatus comprising:
A semiconductor test apparatus comprising:
A semiconductor test apparatus comprising:
Dependencies are inferred from the claim text.