G01R 31/2642
Testing semiconductor operation lifetime or reliability
Official title: {Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests}
G01R31/2642 (Testing semiconductor operation lifetime or reliability) appears on 405 US grants and 428 published applications in this corpus.
Search patents in G01R- Granted patents
- 405
- Published applications
- 428
- Assignees
- 246
- Inventors
- 1,143
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 3 | 0 |
| 1985 | 3 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 4 | 0 |
| 1990 | 4 | 0 |
| 1991 | 2 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 1 | 0 |
| 1997 | 3 | 0 |
| 1998 | 2 | 0 |
| 1999 | 2 | 0 |
| 2000 | 4 | 0 |
| 2001 | 5 | 2 |
| 2002 | 5 | 0 |
| 2003 | 2 | 6 |
| 2004 | 4 | 4 |
| 2005 | 5 | 5 |
| 2006 | 6 | 12 |
| 2007 | 9 | 4 |
| 2008 | 4 | 4 |
| 2009 | 2 | 1 |
| 2010 | 4 | 3 |
| 2011 | 2 | 16 |
| 2012 | 4 | 12 |
| 2013 | 11 | 17 |
| 2014 | 13 | 22 |
| 2015 | 18 | 27 |
| 2016 | 25 | 25 |
| 2017 | 17 | 14 |
| 2018 | 26 | 30 |
| 2019 | 25 | 24 |
| 2020 | 26 | 25 |
| 2021 | 29 | 21 |
| 2022 | 24 | 38 |
| 2023 | 24 | 30 |
| 2024 | 30 | 29 |
| 2025 | 26 | 25 |
| 2026 | 21 | 32 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Low current leakage measurement on a high current unified static and dynamic characterization platform29 Sep 2026US 12,748,145 B2Keithley Instruments, LLC
- Method for testing total dose effect of SiC MOSFET device25 Aug 2026US 12,716,933 B2China Academy of Space Technology
- Pulse current application device and control method of pulse current application device25 Aug 2026US 12,719,458 B2Fuji Electric Co., Ltd.
- Semiconductor module and life prediction system for semiconductor module11 Aug 2026US 12,703,602 B2Mitsubishi Electric Corporation
- Method and device for measuring the state of health of semiconductor-based electronic components11 Aug 2026US 12,704,540 B2Universite Gustave Eiffel
- Semiconductor device defect and fault isolation1 Oct 2026US 2026/0299004 A1Intel Corporation
- Evaluation and performance analysis of discrete fets in parallel configurations for power applications1 Oct 2026US 2026/0299006 A1
- Method for alleviating leakage degradation effect in gan device3 Sep 2026US 2026/0262262 A1Beijing Satellite Factory Co., Ltd.
- Semiconductor integrated circuit and electronic control unit20 Aug 2026US 2026/0243824 A1Astemo, Ltd.
- Distributed federated learning of semiconductor parameters for enhanced manufacturing and design13 Aug 2026US 2026/0235659 A1Tektronix, Inc.
Most cited
By later US patents
- Body bias compensation for aged transistors110US 7,531,836 B2Intel Corporation · 2009
- Test structures for on-chip real-time reliability testing94US 6,724,214 B2Chartered Semiconductor Manufacturing Ltd. · 2004
- Method of estimating lifetime of floating SOI-MOSFET72US 6,173,235 B2Mitsubishi Denki Kabushiki Kaisha · 2001
- System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI)72US 6,731,179 B2International Business Machines Corporation · 2004
- Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same70US 4,855,672 A1989