Low current leakage measurement on a high current unified static and dynamic characterization platform
AssigneeKeithley Instruments, LLC
InventorGregory Sobolewski
Life of this patent
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Abstract
A testing system includes a Device Under Test (DUT) interface structured to couple to one or more DUTs and a device characterization circuit structured to be controlled to perform static testing and dynamic testing of the one or more DUTs. The device characterization circuit includes a drain amplifier coupled to a drain of the one or more DUTs that is structured to measure drain leakage current. Methods of measuring drain current in a device that performs both static and dynamic testing are also described.
Claims20
A testing system, comprising:
- a Device Under Test (DUT) interface structured to couple to one or more DUTs;
- and
- a device characterization circuit structured to be controlled to perform static testing and dynamic testing of the one or more DUTs, including:
- a drain amplifier coupled to a drain of the one or more DUTs and structured to measure drain leakage current, wherein a feedback resistor is coupled between an output of the drain amplifier and an input of the drain amplifier;
- and
- a bypass switch, wherein operation of which enables or disables the drain amplifier to measure drain leakage current.
A test and measurement system, comprising:
- a measurement device;
- and
- a power device, including:
- an interface to allow connection to one or more devices under test (DUTs),
- a switching circuit structured to control an operation of the power device to perform both static testing and dynamic testing of the one or more DUTs, and
- a device characterization circuit under the control of the switching circuit, the device characterization circuit including:
- a drain amplifier coupled to a drain of the one or more DUTs and structured to measure drain leakage current, wherein a feedback resistor is coupled between an output of the drain amplifier and an input of the drain amplifier;
- and
- a bypass switch, the operation of which enables or disables the drain amplifier to measure drain leakage current.
A method in a test environment, comprising:
- accepting an input from a user to perform static or dynamic testing on one or more DUTs in the test environment using a same characterization circuit for both tests;
- selectively enabling or disabling a drain amplifier using a bypass switch;
- and
- measuring drain leakage current from the one or more DUTs through the drain amplifier coupled between the one or more DUTs and a ground reference voltage when the drain amplifier is enabled, wherein a feedback resistor is coupled between an output of the drain amplifier and an input of the drain amplifier.
Dependencies are inferred from the claim text.