Evaluation and performance analysis of discrete fets in parallel configurations for power applications

Abstract

A test and measurement instrument includes two or more probes, each probe configured to be coupled to one field effect transistor (FET) of at least two paralleled FETs operating on a device under test (DUT) to receive signals from a same test point on each of the FETs, one or more analog-to-digital converters (ADCs) to convert the signals to waveforms for each paralleled FET; a display; and one or more processors configured to execute code that causes the one or more processors to: display the waveform for each of the at least two paralleled FET as overlapping waveforms; measure one or more performance characteristics of the at least two paralleled FETs; and identify optimal operating parameters of the at least two paralleled FETs based upon the overlapping waveforms.

Dependencies are inferred from the claim text.