G01R 31/2607
Circuits therefor
Official title: {Circuits therefor (G01R31/2642 takes precedence)}
G01R31/2607 (Circuits therefor) appears on 2,038 US grants and 2,081 published applications in this corpus.
Search patents in G01R- Granted patents
- 2,038
- Published applications
- 2,081
- Assignees
- 946
- Inventors
- 4,737
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 10 | 0 |
| 1977 | 9 | 0 |
| 1978 | 10 | 0 |
| 1979 | 6 | 0 |
| 1980 | 11 | 0 |
| 1981 | 3 | 0 |
| 1982 | 6 | 0 |
| 1983 | 2 | 0 |
| 1984 | 6 | 0 |
| 1985 | 4 | 0 |
| 1986 | 7 | 0 |
| 1987 | 8 | 0 |
| 1988 | 9 | 0 |
| 1989 | 16 | 0 |
| 1990 | 10 | 0 |
| 1991 | 8 | 0 |
| 1992 | 5 | 0 |
| 1993 | 5 | 0 |
| 1994 | 6 | 0 |
| 1995 | 10 | 0 |
| 1996 | 15 | 0 |
| 1997 | 18 | 0 |
| 1998 | 14 | 0 |
| 1999 | 11 | 0 |
| 2000 | 18 | 0 |
| 2001 | 17 | 4 |
| 2002 | 23 | 22 |
| 2003 | 20 | 23 |
| 2004 | 23 | 22 |
| 2005 | 18 | 32 |
| 2006 | 38 | 34 |
| 2007 | 25 | 40 |
| 2008 | 38 | 39 |
| 2009 | 34 | 42 |
| 2010 | 38 | 36 |
| 2011 | 24 | 49 |
| 2012 | 40 | 75 |
| 2013 | 39 | 82 |
| 2014 | 59 | 101 |
| 2015 | 77 | 130 |
| 2016 | 112 | 102 |
| 2017 | 113 | 99 |
| 2018 | 125 | 115 |
| 2019 | 116 | 108 |
| 2020 | 113 | 133 |
| 2021 | 130 | 138 |
| 2022 | 123 | 146 |
| 2023 | 127 | 117 |
| 2024 | 124 | 174 |
| 2025 | 124 | 142 |
| 2026 | 91 | 76 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- System for sensing current through a pass FET6 Oct 2026US 12,754,229 B2Nexperia B. V.
- Low current leakage measurement on a high current unified static and dynamic characterization platform29 Sep 2026US 12,748,145 B2Keithley Instruments, LLC
- Display device and inspecting method thereof29 Sep 2026US 12,749,419 B2Samsung Display Co., Ltd.
- Test vehicle and test method for microelectronic devices22 Sep 2026US 12,745,609 B2Commissariat A L' Energie Atomique Et Aux Energies Alternatives
- Diagnosis and prognosis of IGBT modules15 Sep 2026US 12,736,578 B2ABB Schweiz AG
- Semiconductor device and method of monitoring process defects of semiconductor device8 Oct 2026US 2026/0314337 A1SK hynix Inc.
- System for determining transistor operating characteristics1 Oct 2026US 2026/0299002 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Machine and method for testing light-emitting substrate1 Oct 2026US 2026/0299003 A1Harvatek Corporation
- Evaluation and performance analysis of discrete fets in parallel configurations for power applications1 Oct 2026US 2026/0299006 A1
- Drive circuit24 Sep 2026US 2026/0287637 A1Mitsubishi Electric Corporation
Most cited
By later US patents
- Method and apparatus for testing chemical and ionic sensors194US 4,864,229 AIntegrated Ionics, Inc. · 1989
- Infrared receiver wafer level probe testing165US 5,631,571 AThe United States of America as represented by the Secretary of the Air Force · 1997
- System and method for measuring transistor leakage current with a ring oscillator116US 6,882,172 B1Transmeta Corporation · 2005
- Method of manufacturing a semiconductor device113US 7,105,365 B2Semiconductor Energy Laboratory Co.Ltd. · 2006
- Apparatus for and method of measuring capacitance with high accuracy111US 6,683,462 B2Agilent Technologies, Inc. · 2004