G01R 31/263
For testing thyristors
Official title: {for testing thyristors}
G01R31/263 (For testing thyristors) appears on 41 US grants and 26 published applications in this corpus.
Search patents in G01R- Granted patents
- 41
- Published applications
- 26
- Assignees
- 43
- Inventors
- 105
- Latest grant
- 1 Jul 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 2 | 0 |
| 1978 | 0 | 0 |
| 1979 | 1 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 2 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 2 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 1 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 0 | 1 |
| 2012 | 1 | 1 |
| 2013 | 1 | 2 |
| 2014 | 1 | 2 |
| 2015 | 1 | 3 |
| 2016 | 3 | 1 |
| 2017 | 2 | 2 |
| 2018 | 1 | 0 |
| 2019 | 1 | 0 |
| 2020 | 0 | 2 |
| 2021 | 2 | 3 |
| 2022 | 1 | 2 |
| 2023 | 1 | 3 |
| 2024 | 4 | 1 |
| 2025 | 1 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Analyzing an operation of a power semiconductor device1 Jul 2025US 12,345,754 B2Maschinenfabrik Reinhausen GmbH
- Method of detecting failure of antiparallel thyristor, and power control device3 Sep 2024US 12,078,670 B2Tokyo Electron Limited
- Method for monitoring a protective device that includes a series circuit of thyristors connected in parallel with an electrical device to be protected14 May 2024US 11,982,703 B2Siemens Energy Global GmbH & Co. KG
- DC converter valve state detection method based on temporal features of converter terminal currents16 Apr 2024US 11,959,976 B2South China University of Technology
- Switching module23 Jan 2024US 11,881,702 B2Murata Manufacturing Co., Ltd.
- Electric circuits and triggering detection methods for electric circuits27 Nov 2025US 2025/0364897 A1GE Energy Power Conversion Technology Limited
- Method and device for increasing lifetime of power die or power module15 Aug 2024US 2024/0272222 A1Mitsubishi Electric Corporation
- Analyzing an operation of a power semiconductor device30 Mar 2023US 2023/0096094 A1Maschinenfabrik Reinhausen GmbH
- Method of detecting failure of antiparallel thyristor, and power control device30 Mar 2023US 2023/0100212 A1Tokyo Electron Limited
- Method for monitoring a protective device19 Jan 2023US 2023/0017873 A1Siemens Energy Global GmbH & Co. KG
Most cited
By later US patents
- Multiple thermocouple testing device59US 4,571,689 AThe United States of America as represented by the Secretary of the Air Force · 1986
- Thyristor load detector28US 5,629,571 AGrimes Aerospace Company · 1997
- Tester for solid state electronic components14US 4,924,177 A1990
- Method of automated in-place SCR testing12US 4,633,241 AGeneral Electric Company · 1986
- Method and apparatus for measuring the breakdown voltage of semiconductor devices11US 5,285,151 AHewlett-Packard Company · 1994