G01R 31/2637
For testing other individual devices
Official title: {for testing other individual devices (G01R31/2608 - G01R31/2632, G01R31/27 take precedence)}
G01R31/2637 (For testing other individual devices) appears on 130 US grants and 124 published applications in this corpus.
Search patents in G01R- Granted patents
- 130
- Published applications
- 124
- Assignees
- 102
- Inventors
- 362
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 4 | 0 |
| 1977 | 2 | 0 |
| 1978 | 3 | 0 |
| 1979 | 3 | 0 |
| 1980 | 3 | 0 |
| 1981 | 0 | 0 |
| 1982 | 2 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 2 | 0 |
| 1990 | 3 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 2 | 2 |
| 2003 | 0 | 1 |
| 2004 | 3 | 2 |
| 2005 | 0 | 1 |
| 2006 | 3 | 2 |
| 2007 | 3 | 2 |
| 2008 | 0 | 0 |
| 2009 | 2 | 8 |
| 2010 | 0 | 3 |
| 2011 | 1 | 5 |
| 2012 | 7 | 5 |
| 2013 | 1 | 2 |
| 2014 | 4 | 5 |
| 2015 | 4 | 7 |
| 2016 | 4 | 7 |
| 2017 | 8 | 10 |
| 2018 | 10 | 7 |
| 2019 | 5 | 7 |
| 2020 | 8 | 6 |
| 2021 | 7 | 7 |
| 2022 | 8 | 10 |
| 2023 | 9 | 5 |
| 2024 | 3 | 11 |
| 2025 | 5 | 8 |
| 2026 | 4 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Circuit, method, and apparatus for acquiring resistance values of multiple resistors of target system11 Aug 2026US 12,704,533 B2Sanechips Technology Co., Ltd.
- Testing device, testing method, and non-transitory storage medium storing testing program28 Jul 2026US 12,693,313 B2Sumitomo Electric Industries, Ltd.
- Method for obtaining the dielectric constant of a dielectric sheet14 Jul 2026US 12,681,064 B2Msscorps Co., Ltd.
- Method for obtaining the equivalent oxide thickness of a dielectric layer26 May 2026US 12,638,472 B2Msscorps Co., Ltd.
- Flexible wide bandgap double pulse testing methodology16 Dec 2025US 12,498,410 B2Tektronix, Inc.
- Capacitor leak detect and retire27 Aug 2026US 2026/0251693 A1Micron Technology, Inc.
- Integrated circuit20 Nov 2025US 2025/0355038 A1Fuji Electric Co., Ltd.
- Method for obtaining the dielectric constant of a dielectric sheet6 Nov 2025US 2025/0341555 A1Msscorps Co., Ltd.
- Device and method for characterizing the current collapse of gan transistors25 Sep 2025US 2025/0298069 A1Commissariat A L' Energie Atomique Et Aux Energies Alternatives
- Test device and test method19 Jun 2025US 2025/0203730 A1Tokyo Electron Limited
Most cited
By later US patents
- Apparatus for and method of measuring capacitance with high accuracy111US 6,683,462 B2Agilent Technologies, Inc. · 2004
- Method of manufacturing high-quality semiconductor light-emitting devices98US 4,684,883 AAmerican Telephone and Telegraph Company, AT&T Bell Laboratories · 1987
- Automatic test equipment98US 4,807,161 AMars, Incorporated · 1989
- Printed circuit board fault location system42US 4,714,875 AMars, Incorporated · 1987
- Method and apparatus for measuring the capacitance of complementary field-effect transistor devices34US 4,795,964 ATexas Instruments Incorporated · 1989