G01R 31/2632
For testing diodes
Official title: {for testing diodes}
G01R31/2632 (For testing diodes) appears on 633 US grants and 701 published applications in this corpus.
Search patents in G01R- Granted patents
- 633
- Published applications
- 701
- Assignees
- 457
- Inventors
- 1,662
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 0 | 0 |
| 1978 | 2 | 0 |
| 1979 | 0 | 0 |
| 1980 | 5 | 0 |
| 1981 | 2 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 3 | 0 |
| 1985 | 1 | 0 |
| 1986 | 4 | 0 |
| 1987 | 3 | 0 |
| 1988 | 4 | 0 |
| 1989 | 6 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 4 | 0 |
| 1995 | 5 | 0 |
| 1996 | 4 | 0 |
| 1997 | 3 | 0 |
| 1998 | 5 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 2 | 1 |
| 2002 | 8 | 4 |
| 2003 | 3 | 7 |
| 2004 | 5 | 5 |
| 2005 | 3 | 9 |
| 2006 | 11 | 8 |
| 2007 | 2 | 13 |
| 2008 | 7 | 7 |
| 2009 | 7 | 8 |
| 2010 | 12 | 14 |
| 2011 | 7 | 19 |
| 2012 | 11 | 32 |
| 2013 | 16 | 30 |
| 2014 | 25 | 45 |
| 2015 | 19 | 37 |
| 2016 | 44 | 35 |
| 2017 | 37 | 27 |
| 2018 | 37 | 36 |
| 2019 | 34 | 32 |
| 2020 | 31 | 50 |
| 2021 | 47 | 65 |
| 2022 | 48 | 52 |
| 2023 | 53 | 47 |
| 2024 | 41 | 43 |
| 2025 | 37 | 49 |
| 2026 | 26 | 26 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Display device and inspecting method thereof29 Sep 2026US 12,749,419 B2Samsung Display Co., Ltd.
- Method for controlling the rotational speed or the torque of a motor, rotational speed control system and control device25 Aug 2026US 12,715,305 B2AUMOVIO Germany GmbH
- Micro light-emitting diode detection system and detection method25 Aug 2026US 12,716,774 B2Ji Hua Laboratory
- Electroluminescence inspection apparatus with elastic cores25 Aug 2026US 12,716,934 B2Samsung Electronics Co., Ltd.
- VIOS modulator sensitivity for micro LED backplane array electrical test25 Aug 2026US 12,721,108 B2Orbotech Ltd.
- Machine and method for testing light-emitting substrate1 Oct 2026US 2026/0299003 A1Harvatek Corporation
- Method and system for analyzing defects of light emitting devices10 Sep 2026US 2026/0266889 A1Postech Research and Business Development Foundation
- VCSEL Test Methods and Systems10 Sep 2026US 2026/0266890 A1PicoJool, Inc.
- Transient voltage suppressor failure monitoring circuit20 Aug 2026US 2026/0243817 A1Suzhou Metabrain Intelligent Technology Co., Ltd.
- Method of inspecting a display device and electronic device comprising the display device13 Aug 2026US 2026/0235658 A1Samsung Display Co., Ltd.
Most cited
By later US patents
- Infrared receiver wafer level probe testing165US 5,631,571 AThe United States of America as represented by the Secretary of the Air Force · 1997
- Buried short location determination using voltage contrast inspection97US 7,474,107 B2International Business Machines Corporation · 2009
- Dynamic control of diode bias voltage (photon-caused avalanche)91US 9,048,370 B1Google Inc. · 2015
- Electron-beam probing of photodiodes86US 4,730,158 ASanta Barbara Research Center · 1988
- Light degradation sensing led signal with visible fault mode83US 6,667,623 B2GELcore, LLC · 2003