Method and system for analyzing defects of light emitting devices

Abstract

Provided are method and system for analyzing defects of light emitting devices. According to various embodiments of the present disclosure, a method for analyzing defects of light emitting devices includes: injecting a current into each of N light emitting devices having different sizes at M different temperatures, measuring a photocurrent according to the injected current, and deriving a plurality of data; distinguishing and deriving a bulk defect factor and M×N surface defect factors from each other from the plurality of data; and deriving a first defect concentration for the bulk defect factor and N second defect concentrations for the M×N surface defect factors, wherein M is a natural number of 2 or more, and N is a natural number of 2 or more.

Dependencies are inferred from the claim text.