G01R 31/2633
For measuring switching properties thereof
Official title: {for measuring switching properties thereof}
G01R31/2633 (For measuring switching properties thereof) appears on 24 US grants and 27 published applications in this corpus.
Search patents in G01R- Granted patents
- 24
- Published applications
- 27
- Assignees
- 23
- Inventors
- 64
- Latest grant
- 10 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 1 |
| 2015 | 0 | 2 |
| 2016 | 0 | 0 |
| 2017 | 2 | 3 |
| 2018 | 3 | 2 |
| 2019 | 2 | 2 |
| 2020 | 1 | 2 |
| 2021 | 4 | 4 |
| 2022 | 1 | 3 |
| 2023 | 3 | 4 |
| 2024 | 2 | 2 |
| 2025 | 3 | 2 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method for inspecting electronic components and electronic device10 Mar 2026US 12,571,831 B2Innolux Corporation
- Flexible wide bandgap double pulse testing methodology16 Dec 2025US 12,498,410 B2Tektronix, Inc.
- Reverse recovery measurements and plots1 Jul 2025US 12,345,755 B2Tektronix, Inc.
- System and method for identifying non-switching semiconductor switches21 Jan 2025US 12,203,988 B2LEONI Bordnetz-Systeme GmbH
- Phase distortion measurement3 Dec 2024US 12,158,491 B1Keysight Technologies, Inc.
- Failure detection device17 Apr 2025US 2025/0123318 A1Yazaki Corporation
- Method for checking the switch-off capability of a mosfet13 Feb 2025US 2025/0052805 A1Continental Automotive Technologies GmbH
- Method for inspecting electronic components and electronic device28 Mar 2024US 2024/0103063 A1Innolux Corporation
- Automated de-skew system and method for high voltage semiconductors25 Jan 2024US 2024/0027513 A1Tektronix, Inc.
- Diode voltage measurement systems22 Jun 2023US 2023/0194575 A1Simmonds Precision Products, Inc.
Most cited
By later US patents
- Testing of semiconductor devices4US 5,623,215 ATexas Instruments Incorporated · 1997
- System for measuring soft starter current and method of making same3US 8,896,334 B2Eaton Corporation · 2014
- Transient voltage suppressor bit stimulation2US 11,209,475 B2Hamilton Sundstrand Corporation · 2021
- Intrinsically safe Zener diode barrier with indication1US 10,845,395 B2Honeywell International Inc. · 2020
- Device and method for testing semiconductor devices1US 11,733,287 B2Innoscience (Zhuhai) Technology Co., Ltd. · 2023