Reverse recovery measurements and plots
AssigneeTektronix, Inc.
InventorsVivek Shivaram, Niranjan R Hegde, Parjanya Adiga, Krishna N H Sri, Tsuyoshi Miyazaki, Yogesh M. Pai, Venkatraj Melinamane
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AssigneeTektronix, Inc.
InventorsVivek Shivaram, Niranjan R Hegde, Parjanya Adiga, Krishna N H Sri, Tsuyoshi Miyazaki, Yogesh M. Pai, Venkatraj Melinamane
Estimating the term…
A test and measurement instrument has a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to: receive waveform data from the DUT, locate one or more reverse recovery regions in the waveform data, determine a reverse recovery time for the DUT from the reverse recovery region, and display a reverse recovery plot of the one or more reverse recovery regions on the user interface. A method of providing reverse recovery measurements for a device under test (DUT) includes receiving waveform data through one or more probes from the DUT, locating one or more reverse recovery regions in the waveform data, determining a reverse recovery time for the DUT for the one or more reverse recovery regions, and displaying a reverse recovery plot of the one or more reverse recovery regions on the user interface.
A test and measurement instrument, comprising:
A method of providing reverse recovery measurements for a device under test (DUT), comprising:
Dependencies are inferred from the claim text.