Back to results
US 11,209,475 B2Granted
Transient voltage suppressor bit stimulation
AssigneeHamilton Sundstrand Corporation
InventorRobert Annan Barnet
Life of this patent
Estimating the term…
Abstract
A transient voltage suppressor (TVS) can include an input line, a return line, and a plurality of TVS diodes disposed in series between the input line and the return line. The TVS can include a switch assembly operatively connected to the plurality of TVS diodes and configured to bypass at least one of the plurality of TVS diodes to allow a remainder of the plurality of TVS diodes to be tested at a voltage that is lower than if the switch assembly were not employed.
Claims18
A transient voltage suppressor (TVS), comprising:
- an input line;
- a return line;
- a plurality of TVS diodes disposed in series between the input line and the return line;
- and
- a switch assembly operatively connected to the plurality of TVS diodes and configured to bypass at least one of the plurality of TVS diodes to allow a remainder of the plurality of TVS diodes to be tested at a voltage that is lower than if the switch assembly were not employed, wherein the switch assembly can include one or more switches connected between a first pair of the plurality of TVS diodes and the return line and between the first pair and a second pair of TVS diodes via one or more test lines connected at a test point between a respective pair of the plurality of TVS diodes, such that one pair of diodes can be bypassed at the same time as the remaining pair of diodes is being tested.
2 more elements
An aircraft system, comprising:
- a transient voltage suppressor (TVS), comprising:
- an input line;
- a return line;
- and
- a plurality of TVS diodes disposed in series between the input line and the return line;
- and
- a switch assembly operatively connected to the series of TVS diodes and configured to bypass at least one TVS diode to reduce test voltage to test a remainder of TVS diodes, wherein the switch assembly can include one or more switches connected between a first pair of the plurality of TVS diodes and the return line and between the first pair and a second pair of TVS diodes via one or more test lines connected at a test point between a respective pair of the plurality of TVS diodes, such that one pair of diodes can be bypassed at the same time as the remaining pair of diodes is being tested.
4 more elements
A method, comprising:
- bypassing at least one of a plurality of transient voltage suppressor diodes of a transient voltage suppressor to allow a remainder of the plurality of transient voltage suppressor diodes to be tested at a voltage less than if the bypassing were not performed, wherein bypassing includes bypassing one pair of diodes at the same time as the remaining pair of diodes is being tested.
Dependencies are inferred from the claim text.