G01R 31/2635
Testing light-emitting diodes, laser diodes or photodiodes
Official title: {Testing light-emitting diodes, laser diodes or photodiodes}
G01R31/2635 (Testing light-emitting diodes, laser diodes or photodiodes) appears on 505 US grants and 599 published applications in this corpus.
Search patents in G01R- Granted patents
- 505
- Published applications
- 599
- Assignees
- 370
- Inventors
- 1,360
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 2 | 0 |
| 1985 | 1 | 0 |
| 1986 | 2 | 0 |
| 1987 | 1 | 0 |
| 1988 | 2 | 0 |
| 1989 | 2 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 2 | 0 |
| 1995 | 3 | 0 |
| 1996 | 3 | 0 |
| 1997 | 2 | 0 |
| 1998 | 4 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 1 |
| 2002 | 6 | 4 |
| 2003 | 3 | 6 |
| 2004 | 5 | 4 |
| 2005 | 1 | 7 |
| 2006 | 9 | 7 |
| 2007 | 1 | 11 |
| 2008 | 7 | 6 |
| 2009 | 5 | 8 |
| 2010 | 12 | 14 |
| 2011 | 7 | 18 |
| 2012 | 11 | 31 |
| 2013 | 15 | 28 |
| 2014 | 23 | 39 |
| 2015 | 18 | 31 |
| 2016 | 36 | 29 |
| 2017 | 30 | 22 |
| 2018 | 30 | 29 |
| 2019 | 26 | 27 |
| 2020 | 28 | 43 |
| 2021 | 38 | 52 |
| 2022 | 41 | 43 |
| 2023 | 40 | 35 |
| 2024 | 36 | 40 |
| 2025 | 28 | 43 |
| 2026 | 22 | 21 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Micro light-emitting diode detection system and detection method25 Aug 2026US 12,716,774 B2Ji Hua Laboratory
- Electroluminescence inspection apparatus with elastic cores25 Aug 2026US 12,716,934 B2Samsung Electronics Co., Ltd.
- VIOS modulator sensitivity for micro LED backplane array electrical test25 Aug 2026US 12,721,108 B2Orbotech Ltd.
- Testing method for headlamps, and testing device11 Aug 2026US 12,703,300 B2Hella GmbH & Co. KGaA
- Apparatus and method for testing elevator display unit and elevator system11 Aug 2026US 12,703,604 B2Otis Elevator Company
- Machine and method for testing light-emitting substrate1 Oct 2026US 2026/0299003 A1Harvatek Corporation
- Method and system for analyzing defects of light emitting devices10 Sep 2026US 2026/0266889 A1Postech Research and Business Development Foundation
- VCSEL Test Methods and Systems10 Sep 2026US 2026/0266890 A1PicoJool, Inc.
- Method of inspecting a display device and electronic device comprising the display device13 Aug 2026US 2026/0235658 A1Samsung Display Co., Ltd.
- Micro-led systems having in situ current measurement circuits6 Aug 2026US 2026/0229156 A1Microsoft Technology Licensing, LLC
Most cited
By later US patents
- Infrared receiver wafer level probe testing165US 5,631,571 AThe United States of America as represented by the Secretary of the Air Force · 1997
- Dynamic control of diode bias voltage (photon-caused avalanche)91US 9,048,370 B1Google Inc. · 2015
- Electron-beam probing of photodiodes86US 4,730,158 ASanta Barbara Research Center · 1988
- Light degradation sensing led signal with visible fault mode83US 6,667,623 B2GELcore, LLC · 2003
- Apparatus for wafer probing having surface level sensing79US 3,996,517 AMonsanto Company · 1976