US 2026/0299003 A1 · MACHINE AND METHOD FOR TESTING LIGHT-EMITTING SUBSTRATE

Abstract

A machine and method for testing a light-emitting substrate. In the method, a test board is provided in a test region and includes a first conductive region and a second conductive region having different electrical characteristics. Afterwards, an anisotropic conductive layer is disposed on the test board and covers the first conductive region and the second conductive region. Then, a light-emitting substrate is held in the test region, and one of the light-emitting substrate and the test board is driven to move toward the other, such that the anisotropic conductive layer is pressed between the light-emitting substrate and the test board to establish signal conduction. Finally, a test signal is provided to the light-emitting substrate through the test board.

Claims16

Dependent claims

A method for testing a light-emitting substrate, comprising:

providing a test board in a test region;
disposing an anisotropic conductive layer on the test board;
holding a light-emitting substrate at a position aligned with the test region, and driving one of the light-emitting substrate and the test board to move toward the other, so as to establish signal conduction between the light-emitting substrate and the test board through the anisotropic conductive layer;
and
providing a test signal to the light-emitting substrate through the test board, and determining performance of the light-emitting substrate according to one or more of light-emitting characteristics or electrical signals generated by the light-emitting substrate in response to the test signal.

2 more elements

A machine for testing a light-emitting substrate, comprising:

a test region;
a test assembly disposed in the test region, the test assembly including a test board and an anisotropic conductive layer disposed on the test board;
a holder configured to hold a light-emitting substrate in the test region;
and
a driver configured to drive one of the light-emitting substrate and the test board to move toward the other, so as to establish signal conduction between the light-emitting substrate and the test board through the anisotropic conductive layer;
the machine is configured to provide a test signal to the light-emitting substrate through the test board, and to determine performance of the light-emitting substrate according to one or more of light-emitting characteristics or electrical signals generated by the light-emitting substrate in response to the test signal.

3 more elements

Dependencies are inferred from the claim text.

Machine and method for testing light-emitting substrate

Life of this patent

Machine and method for testing light-emitting substrate

Life of this patent

Abstract

Claims16