G01R 31/2621
For testing field effect transistors, i.e. fet's
Official title: {for testing field effect transistors, i.e. FET's}
G01R31/2621 (For testing field effect transistors, i.e. fet's) appears on 877 US grants and 912 published applications in this corpus.
Search patents in G01R- Granted patents
- 877
- Published applications
- 912
- Assignees
- 411
- Inventors
- 2,045
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 2 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 4 | 0 |
| 1990 | 3 | 0 |
| 1991 | 3 | 0 |
| 1992 | 2 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 7 | 0 |
| 1997 | 12 | 0 |
| 1998 | 8 | 0 |
| 1999 | 9 | 0 |
| 2000 | 15 | 0 |
| 2001 | 12 | 2 |
| 2002 | 13 | 16 |
| 2003 | 15 | 13 |
| 2004 | 12 | 9 |
| 2005 | 13 | 18 |
| 2006 | 21 | 19 |
| 2007 | 17 | 20 |
| 2008 | 26 | 27 |
| 2009 | 22 | 23 |
| 2010 | 20 | 14 |
| 2011 | 15 | 16 |
| 2012 | 18 | 28 |
| 2013 | 12 | 23 |
| 2014 | 16 | 24 |
| 2015 | 24 | 52 |
| 2016 | 31 | 45 |
| 2017 | 40 | 40 |
| 2018 | 57 | 46 |
| 2019 | 37 | 47 |
| 2020 | 49 | 64 |
| 2021 | 53 | 49 |
| 2022 | 54 | 56 |
| 2023 | 53 | 49 |
| 2024 | 48 | 102 |
| 2025 | 74 | 70 |
| 2026 | 46 | 40 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- System for sensing current through a pass FET6 Oct 2026US 12,754,229 B2Nexperia B. V.
- Low current leakage measurement on a high current unified static and dynamic characterization platform29 Sep 2026US 12,748,145 B2Keithley Instruments, LLC
- GaN reliability built-in self test (BIST) apparatus and method for qualifying dynamic on-state resistance degradation1 Sep 2026US 12,724,061 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Method for testing total dose effect of SiC MOSFET device25 Aug 2026US 12,716,933 B2China Academy of Space Technology
- Self heating extraction design and methodology with power consumption correction18 Aug 2026US 12,710,319 B2International Business Machines Corporation
- Evaluation and performance analysis of discrete fets in parallel configurations for power applications1 Oct 2026US 2026/0299006 A1
- On-die parameter measuring circuit and method for operating the same24 Sep 2026US 2026/0287638 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Gate charge de-embedding24 Sep 2026US 2026/0287639 A1X-FAB France SAS
- Current sensing circuit and method for sensing a source drain current of a switch transistor24 Sep 2026US 2026/0287640 A1Infineon Technologies Austria AG
- Method of automatically searching for leakage current path17 Sep 2026US 2026/0276736 A1Renesas Design (UK) Limited
Most cited
By later US patents
- Method and apparatus for testing chemical and ionic sensors194US 4,864,229 AIntegrated Ionics, Inc. · 1989
- System and method for measuring transistor leakage current with a ring oscillator116US 6,882,172 B1Transmeta Corporation · 2005
- Active feedback pulsed measurement method102US 6,396,298 B1The Aerospace Corporation · 2002
- Systems and methods for integrated circuits comprising multiple body bias domains99US 7,256,639 B1Transmeta Corporation · 2007
- Method for making die-compensated threshold tuning circuit90US 6,048,746 ASun Microsystems, Inc. · 2000