G01R 31/2628
For measuring thermal properties thereof
Official title: {for measuring thermal properties thereof}
G01R31/2628 (For measuring thermal properties thereof) appears on 84 US grants and 106 published applications in this corpus.
Search patents in G01R- Granted patents
- 84
- Published applications
- 106
- Assignees
- 76
- Inventors
- 245
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2002 | 2 | 2 |
| 2003 | 2 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 3 |
| 2006 | 5 | 2 |
| 2007 | 0 | 2 |
| 2008 | 1 | 0 |
| 2009 | 1 | 1 |
| 2010 | 1 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 2 |
| 2014 | 1 | 1 |
| 2015 | 3 | 6 |
| 2016 | 2 | 10 |
| 2017 | 7 | 6 |
| 2018 | 10 | 8 |
| 2019 | 3 | 7 |
| 2020 | 5 | 7 |
| 2021 | 5 | 8 |
| 2022 | 6 | 9 |
| 2023 | 9 | 10 |
| 2024 | 10 | 10 |
| 2025 | 6 | 6 |
| 2026 | 5 | 4 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Self heating extraction design and methodology with power consumption correction18 Aug 2026US 12,710,319 B2International Business Machines Corporation
- Method and device for measuring the state of health of semiconductor-based electronic components11 Aug 2026US 12,704,540 B2Universite Gustave Eiffel
- Switching transient based junction temperature estimation of SiC MOSFETs with aging compensation24 Mar 2026US 12,584,799 B2Board of Regents, The University of Texas System
- Power semiconductor circuit and method for determining a temperature of a power semiconductor component17 Mar 2026US 12,578,235 B2Infineon Technologies AG
- Method of monitoring reliability of system including electrical components24 Feb 2026US 12,560,641 B2Aptiv Technologies AG
- Evaluation and performance analysis of discrete fets in parallel configurations for power applications1 Oct 2026US 2026/0299006 A1
- Testing rf signal content and power20 Aug 2026US 2026/0246540 A1Teradyne, Inc.
- Circuitry for allowing multiple sensors on a semiconductor die to share a common sensor pad16 Apr 2026US 2026/0104295 A1Wolfspeed, Inc.
- Systems and methods of power electronic analysis and control15 Jan 2026US 2026/0016527 A1Uchicago Argonne, LLC
- Fault detection and protection of battery with external field-effect transistors18 Sep 2025US 2025/0290968 A1Cirrus Logic International Semiconductor Ltd.
Most cited
By later US patents
- Mobile ionic contamination detection in manufacture of semiconductor devices90US 6,348,808 B1LSI Logic Corporation · 2002
- System and method for measuring negative bias thermal instability with a ring oscillator18US 7,126,365 B2Transmeta Corporation · 2006
- Test structure for automatic dynamic negative-bias temperature instability testing9US 7,103,861 B2Chartered Semiconductor Manufacturing Ltd. · 2006
- Testing and setting performance parameters in a semiconductor device and method therefor6US 9,645,191 B22017
- Devices under test5US 9,778,313 B2Texas Instruments Incorporated · 2017