Devices under test

A method comprising:

• applying a stress condition to a plurality of devices under test (DUTs);
• applying a measurement condition to a given DUT in the plurality of DUTs while concurrently maintaining the stress condition on a remaining DUTs in the plurality of DUTs, wherein applying the stress condition is configured to shunt leakage current of the remaining DUTs away from the given DUT;
• repeating the applying for each DUT in the plurality of DUTs;
• and
• determining degradation parameters of each DUT in the plurality of DUTs.

A method comprising:

• applying a first test condition to a plurality of DUTs, wherein the first test condition comprises:
• applying a first stress condition to each of the plurality of DUTs, wherein the first stress condition is configured to apply a stress voltage to each of the plurality of DUTs that is higher or lower than a rated voltage of each of the plurality of DUTs;
• applying a first measurement condition to a given DUT of the plurality of DUTs while maintaining the first stress condition at each of the remaining DUTs of the plurality of DUTs;
• measuring a drain current at the given DUT;
• and
• repeating the applying of the first stress condition and the first measurement condition for each DUT in the plurality of DUTs;
• and
• applying a second test condition to the plurality of DUTs, wherein the second test condition comprises:
• applying a second stress condition to each of the plurality of DUTs, wherein the second stress condition is configured to apply the stress voltage to each of the plurality of DUTs;
• applying a second measurement condition to a given DUT of the plurality of DUTs while maintaining the first stress condition at each of the remaining DUTs of the plurality of DUTs;
• measuring a gate current at the given DUT;
• and
• repeating the applying of the second stress condition and the second measurement condition for each DUT in the plurality of DUTs, wherein the first and second stress conditions are configured to shunt leakage current for each of the remaining DUTs of the plurality of DUTs current to a sink.