Testing rf signal content and power

A test system comprising:

• a device interface board (DIB) containing a device under test (DUT);
• a module on the DIB, the module comprising:
• a power detector that is connectable to an output port of the DUT to receive a first radio frequency (RF) signal or a first part of the first RF signal from the DUT, the power detector to detect a power of the first RF signal or of the first part of the first RF signal;
• and
• an attenuator that is connectable to the outport port of the DUT and connectable to or connected to an input port of the DUT, the attenuator to receive a second RF signal or a second part of the first RF signal from the DUT and to attenuate the second RF signal or the second part of the first RF signal to produce an attenuated RF signal for output to the input port of the DUT;
• and
• one or more test instruments configured to control operation of at least part of the module, the one or more test instruments being configured (i) to provide first data to the DUT, the first RF signal or the first part of the first RF signal containing the first data, (ii) to obtain information from the DUT that is based on second data received by the DUT in the second RF signal or in the second part of the first RF signal, and (iii) and to determine whether the DUT passed or failed testing based on the information.