G01R 31/2626
For measuring noise
Official title: {for measuring noise (measuring noise factor in general G01R29/26)}
G01R31/2626 (For measuring noise) appears on 28 US grants and 25 published applications in this corpus.
Search patents in G01R- Granted patents
- 28
- Published applications
- 25
- Assignees
- 26
- Inventors
- 68
- Latest grant
- 28 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 1 | 0 |
| 2013 | 0 | 1 |
| 2014 | 1 | 2 |
| 2015 | 4 | 0 |
| 2016 | 2 | 3 |
| 2017 | 2 | 1 |
| 2018 | 1 | 0 |
| 2019 | 0 | 2 |
| 2020 | 2 | 3 |
| 2021 | 2 | 2 |
| 2022 | 2 | 2 |
| 2023 | 4 | 1 |
| 2024 | 0 | 3 |
| 2025 | 2 | 2 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Inspection device and electronic control device28 Jul 2026US 12,693,326 B2Denso Corporation
- Diagnostic ring oscillator circuit for DC and transient characterization12 May 2026US 12,625,180 B2Intel NDTM US LLC
- Diagnostic ring oscillator circuit for DC and transient characterization11 Nov 2025US 12,467,974 B2Intel NDTM US LLC
- Systems and method to test semiconductor devices2 Sep 2025US 12,405,300 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Direct current measurement of 1/f transistor noise24 Oct 2023US 11,796,588 B2Texas Instruments Incorporated
- Diagnostic ring oscillator circuit for dc and transient characterization5 Mar 2026US 2026/0063715 A1Intel NDTM US LLC
- Systems and method to test semiconductor devices23 Oct 2025US 2025/0327849 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Machine Learning-based Tool to Characterize Individual Oxide Defects8 May 2025US 2025/0147094 A1
- Inspection device and electronic control device14 Nov 2024US 2024/0377451 A1Denso Corporation
- Improved diagnostic ring oscillator circuit for dc and transient characterization18 Jul 2024US 2024/0243735 A1Intel NDTM US LLC
Most cited
By later US patents
- Method of measuring FET noise parameters43US 4,908,570 AHughes Aircraft Company · 1990
- Detecting breakdown in dielectric layers20US 5,804,975 ALucent Technologies Inc. · 1998
- Detecting defects in integrated circuits16US 6,043,662 A2000
- Noise parameter measurement system and method12US 8,786,293 B12014
- Methods and systems to determine a final value of random telegraph noise time constant and magnitude12US 9,110,111 B1Texas Instruments Incorporated · 2015