G01R 31/2625
For measuring gain factor thereof
Official title: {for measuring gain factor thereof}
G01R31/2625 (For measuring gain factor thereof) appears on 15 US grants and 14 published applications in this corpus.
Search patents in G01R- Granted patents
- 15
- Published applications
- 14
- Assignees
- 15
- Inventors
- 38
- Latest grant
- 27 May 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 2 |
| 2008 | 1 | 0 |
| 2009 | 1 | 1 |
| 2010 | 1 | 1 |
| 2011 | 0 | 1 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 1 |
| 2015 | 1 | 2 |
| 2016 | 0 | 1 |
| 2017 | 1 | 3 |
| 2018 | 3 | 0 |
| 2019 | 0 | 0 |
| 2020 | 2 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 1 |
| 2023 | 0 | 1 |
| 2024 | 1 | 0 |
| 2025 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Method and apparatus for determining gate capacitance27 May 2025US 12,313,663 B2Microsoft Technology Licensing, LLC
- Monitoring circuit monitoring performance of transistors14 May 2024US 11,982,702 B2SK hynix Inc.
- Non-contact method to monitor and quantify effective work function of metals1 Sep 2020US 10,763,179 B2SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Compact millimeter-wave tuner30 Jun 2020US 10,700,402 B1
- Methods of predicting unity gain frequency with direct current and/or low frequency parameters2 Oct 2018US 10,090,209 B2Globalfoundries Inc.
- Method and apparatus for determining gate capacitance29 Jun 2023US 2023/0204642 A1Microsoft Technology Licensing, LLC
- Monitoring circuit monitoring performance of transistors3 Nov 2022US 2022/0349933 A1SK hynix Inc.
- Semiconductor Devices and Methods for Testing a Gate Insulation of a Transistor Structure2 Nov 2017US 2017/0316991 A1Infineon Technologies AG
- Methods of predicting unity gain frequency with direct current and/or low frequency parameters21 Sep 2017US 2017/0271213 A1Globalfoundries Inc.
- Semiconductor device and method of inspecting a semiconductor device4 May 2017US 2017/0122997 A1Sii Semiconductor Corporation
Most cited
By later US patents
- Method for testing semiconductor element21US 5,905,384 AMitsubishi Denki Kabushiki Kaisha · 1999
- Manufacturing method and test method of semiconductor device11US 8,912,016 B2Semiconductor Energy Laboratory Co.Ltd. · 2014
- Calibration technique for measuring gate resistance of power MOS gate device at wafer level9US 8,174,283 B2Alpha and Omega Semiconductor Incorporated · 2012
- Compact millimeter-wave tuner8US 10,700,402 B12020
- Calibration technique for measuring gate resistance of power MOS gate device at water level6US 7,535,021 B2Alpha and Omega Semiconductor Incorporated · 2009