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US 6,882,172 B1Granted
System and method for measuring transistor leakage current with a ring oscillator
AssigneeTransmeta Corporation
InventorsShingo Suzuki, James Burr
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Abstract
A method of measuring the transistor leakage current. In one embodiment, the method involves driving a ring oscillator with a dynamic node driver having a leakage test device biased to an off state to produce a test signal. The test signal is extracted and the frequency is measured. The leakage current is estimated from the measured frequency.
Claims7
A method of estimating leakage current, said method comprising:
- driving a ring oscillator with a dynamic node driver, said dynamic node driver comprising:
- a pre-charge device;
- and a leakage test device, said leakage test device biased to an off state with said pre-charge device coupled to said leakage test device at a dynamic node;
- extracting a test signal from said ring oscillator;
- measuring a test frequency from said test signal;
- and
- estimating a leakage current of said leakage test device from said test frequency.
4 more elements
Dependencies are inferred from the claim text.