On-die parameter measuring circuit and method for operating the same

An integrated circuit, comprising:

• a plurality of first-type devices under test (DUTs);
• a plurality of second-type DUTs;
• a parameter measuring circuit;
• and
• a switch circuit, comprising a plurality of respective first switch sets of the first-type DUTs, and a plurality of respective second switch sets of the second-type DUTs,
• wherein one of the first-type DUTs and its respective first switch set, or one of the second-type DUTs and its respective second switch set are activated according to a control signal from external test equipment and a voltage domain of a plurality of power supply voltage signals provided to the integrated circuit,
• wherein the parameter measuring circuit is configured to generate an output current from a test current, which is generated by the activated first-type DUT or second-type DUT, using an adjustable mirror ratio, and send the output current to the external test equipment for measurement.

A method, comprising:

• providing an integrated circuit with a plurality of first-type devices under test (DUTs) and a plurality of second-type DUTs;
• and
• in response to a plurality of power supply voltage signals provided to the integrated circuit being within a first voltage domain:
• activating one of the first DUTs and its respective switch set according to a control signal from external test equipment;
• deactivating the second-type DUTs and their respective switch sets;
• and
• mirroring a first test current generated by the activated first-type DUT with a first adjustable mirror ratio to generate a first output current.