G01R 31/2641
For testing charge coupled devices
Official title: {for testing charge coupled devices}
G01R31/2641 (For testing charge coupled devices) appears on 9 US grants and 11 published applications in this corpus.
Search patents in G01R- Granted patents
- 9
- Published applications
- 11
- Assignees
- 12
- Inventors
- 39
- Latest grant
- 4 Jan 2022
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 2 |
| 2007 | 1 | 1 |
| 2008 | 0 | 2 |
| 2009 | 0 | 1 |
| 2010 | 0 | 2 |
| 2011 | 1 | 0 |
| 2012 | 2 | 1 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 1 |
| 2017 | 1 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 1 |
| 2021 | 0 | 0 |
| 2022 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Inspection apparatus and inspection method4 Jan 2022US 11,215,526 B2Sony Semiconductor Solutions Corporation
- Method and device for testing an image sensor and motor vehicle13 Jun 2017US 9,681,124 B2Robert Bosch GmbH
- Circuit for continuously measuring discontinuous metal insulator transition of MIT element and MIT sensor using the same26 Jun 2012US 8,207,750 B2Electronics and Telecommunications Research Institute
- Optical device inspecting apparatus17 Apr 2012US 8,159,659 B2Japan Electronic Materials Corporation
- Integrated light conditioning devices on a probe card for testing imaging devices, and methods of fabricating same11 Jan 2011US 7,868,630 B2Micron Technology, Inc.
- Inspection apparatus and inspection method, and program17 Sep 2020US 2020/0292414 A1Sony Semiconductor Solutions Corporation
- Method and device for testing an image sensor and motor vehicle11 Feb 2016US 2016/0044307 A1Robert Bosch GmbH
- Optical device inspecting apparatus2 Aug 2012US 2012/0194211 A1
- Circuit for continuously measuring discontinuous metal insulator transition of mit element and mit sensor using the same22 Jul 2010US 2010/0182034 A1Electronics and Telecommunications Research Institute
- Optical device inspecting apparatus4 Mar 2010US 2010/0053601 A1Japan Electronic Materials Corporation
Most cited
By later US patents
- Non-linear photosite response in CCD imagers31US 5,055,667 ALoral Fairchild Corporation · 1991
- Method of testing a charge-coupled device7US 4,942,357 AEastman Kodak Company · 1990
- Charge collection control circuit for use with charge-coupled photodetector arrays6US 5,268,567 AX-Ray Scanner Corporation · 1993
- Integrated light conditioning devices on a probe card for testing imaging devices, and methods of fabricating same4US 7,868,630 B2Micron Technology, Inc. · 2011
- System and method for testing CMOS image sensor3US 7,251,576 B2Advanced Semiconductor Engineering, Inc. · 2007