G01R 31/2608
For testing bipolar transistors
Official title: {for testing bipolar transistors}
G01R31/2608 (For testing bipolar transistors) appears on 272 US grants and 259 published applications in this corpus.
Search patents in G01R- Granted patents
- 272
- Published applications
- 259
- Assignees
- 169
- Inventors
- 658
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 2 | 0 |
| 1978 | 2 | 0 |
| 1979 | 2 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 2 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 3 | 0 |
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 2 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 2 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 2 |
| 2005 | 2 | 1 |
| 2006 | 2 | 3 |
| 2007 | 0 | 1 |
| 2008 | 3 | 0 |
| 2009 | 1 | 1 |
| 2010 | 1 | 1 |
| 2011 | 0 | 3 |
| 2012 | 0 | 6 |
| 2013 | 0 | 6 |
| 2014 | 7 | 12 |
| 2015 | 11 | 20 |
| 2016 | 15 | 11 |
| 2017 | 20 | 12 |
| 2018 | 16 | 24 |
| 2019 | 24 | 16 |
| 2020 | 22 | 21 |
| 2021 | 18 | 18 |
| 2022 | 24 | 35 |
| 2023 | 15 | 18 |
| 2024 | 26 | 19 |
| 2025 | 16 | 19 |
| 2026 | 14 | 9 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01R 31/2619For measuring thermal properties thereof51
- G01R 31/2617For measuring switching properties thereof34
- G01R 31/261For measuring break-down voltage or punch through voltage therefor27
- G01R 31/2612For measuring frequency response characteristics23
- G01R 31/2614For measuring gain factor thereof16
- G01R 31/2616For measuring noise10
Recent patents
- Diagnosis and prognosis of IGBT modules15 Sep 2026US 12,736,578 B2ABB Schweiz AG
- Electronic circuit simulation based on random telegraph signal noise25 Aug 2026US 12,716,932 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Method and device for measuring the state of health of semiconductor-based electronic components11 Aug 2026US 12,704,540 B2Universite Gustave Eiffel
- System and method for determining probe skew28 Jul 2026US 12,693,325 B2Tektronix, Inc.
- Test method21 Jul 2026US 12,687,572 B2Fuji Electric Co., Ltd.
- Current measurement6 Aug 2026US 2026/0227460 A1STMicroelectronics International N. V.
- State estimation system and state estimation method for power conversion semiconductor apparatus30 Jul 2026US 2026/0219302 A1Kyushu Institute of Technology
- Power-Semiconductor-Device Test Apparatus Facilitating Test-Connection Changes23 Jul 2026US 2026/0211026 A1Qualtec Co., Ltd.
- Kelvin scheme package25 Jun 2026US 2026/0177605 A1Semiconductor Components Industries, LLC
- Methods and apparatus to identify a state change of a switch30 Apr 2026US 2026/0118404 A1
Most cited
By later US patents
- DC biasing and AC loading of high gain frequency transistors54US 5,495,180 AThe United States of America as represented by the Secretary of the Air Force · 1996
- Method for calibration and tuning with impedance tuners44US 9,625,556 B12017
- Gate driver with VGTH and VCESAT measurement capability for the state of health monitor43US 10,291,225 B2Texas Instruments Incorporated · 2019
- Evaluation method for semiconductor device26US 4,968,932 AKabushiki Kaisha Toshiba · 1990
- Method of characterizing reliability in bipolar semiconductor devices25US 4,520,448 AInternational Business Machines Corporation · 1985