G01R 31/2619
For measuring thermal properties thereof
Official title: {for measuring thermal properties thereof}
G01R31/2619 (For measuring thermal properties thereof) appears on 51 US grants and 64 published applications in this corpus.
Search patents in G01R- Granted patents
- 51
- Published applications
- 64
- Assignees
- 46
- Inventors
- 166
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 1 | 2 |
| 2015 | 1 | 3 |
| 2016 | 2 | 1 |
| 2017 | 3 | 3 |
| 2018 | 3 | 7 |
| 2019 | 3 | 7 |
| 2020 | 4 | 5 |
| 2021 | 3 | 6 |
| 2022 | 8 | 8 |
| 2023 | 4 | 7 |
| 2024 | 7 | 5 |
| 2025 | 5 | 7 |
| 2026 | 3 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Diagnosis and prognosis of IGBT modules15 Sep 2026US 12,736,578 B2ABB Schweiz AG
- Method and device for measuring the state of health of semiconductor-based electronic components11 Aug 2026US 12,704,540 B2Universite Gustave Eiffel
- Power semiconductor circuit and method for determining a temperature of a power semiconductor component17 Mar 2026US 12,578,235 B2Infineon Technologies AG
- Semiconductor device30 Dec 2025US 12,510,582 B2Fuji Electric Co., Ltd.
- State determination device and vehicle30 Dec 2025US 12,510,583 B2Denso Corporation
- Semiconductor device with aging sensor system and method therefor23 Apr 2026US 2026/0110727 A1NXP B. V.
- Comparative device operating temperature anomaly detection11 Dec 2025US 2025/0377398 A1Inventus Holdings, LLC
- Apparatus and method for estimating temperature and main current of power semiconductor element5 Jun 2025US 2025/0180626 A1Mitsubishi Electric Corporation
- Method and device for inspecting junction portion of power module10 Apr 2025US 2025/0116695 A1Hyundai Motor Company
- Semiconductor device20 Mar 2025US 2025/0098192 A1Fuji Electric Co., Ltd.
Most cited
By later US patents
- Method and apparatus for electrical component life estimation12US 9,869,722 B1Rockwell Automation Technologies, Inc. · 2018
- Fail-safe photoelectric detector10US 5,121,975 ASpacesaver Corporation · 1992
- Testing device9US 11,340,283 B2Tokyo Electron Limited · 2022
- Desaturation detection circuit and desaturation circuit monitoring function8US 10,473,710 B2Avago Technologies International Sales Pte. Limited · 2019
- System for and method of testing transistors5US 4,368,425 ADBX, Inc. · 1983