Method and apparatus for electrical component life estimation
AssigneeRockwell Automation Technologies, Inc.
InventorGarron K. Morris
Life of this patent
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AssigneeRockwell Automation Technologies, Inc.
InventorGarron K. Morris
Estimating the term…
Systems and methods for estimating electrical component degradation caused by an operating parameter that stresses the component in a series of stress cycles, in which cycle count values are maintained which individually correspond to a range of values of the operating parameter, and a plurality of maximum cycle values are stored, which individually correspond to one of the ranges and represent the number of stress cycles in the corresponding range at which the component is expected to have a user defined failure probability value. For a given stress cycle, one of the count values is incremented that corresponds to the range that includes a measured or sensed value, and a cumulative degradation value for the electrical system component is computed as a sum of ratios of the individual count values to the corresponding maximum cycle values.
A method for estimating degradation of an electrical system component caused by an operating parameter that stresses the electrical system component for each of series of stress cycles, the method comprising:
A non-transitory computer readable medium with computer executable instructions for estimating degradation of an electrical system component caused by an operating parameter that stresses the electrical system component for each of series of stress cycles, the computer readable medium comprising computer-executable instructions which, when executed by a processor, cause the processor to:
A system for estimating degradation of an electrical system component caused by an operating parameter that stresses the electrical system component for each of series of stress cycles, the system comprising:
Dependencies are inferred from the claim text.