State determination device and vehicle
AssigneeDenso Corporation
InventorsJunya Muramatsu, Ryosuke Okachi, Katsuhiro Kutsuki, Takashi Tominaga, Masataka Deguchi
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Abstract
A state determination device includes an initial waveform storage unit, a waveform acquisition unit, an element temperature acquisition unit, a past waveform storage unit, and a failure state determination unit. The failure state determination unit classifies the time waveform based on the initial time waveform of the gate voltage, the current time waveform of the gate voltage, the element temperature, and the past time waveform of the gate voltage, and determines a fault condition of the IGBT.
Claims10
A state determination device, comprising a processor circuit configured to:
- acquire, as a gate voltage waveform acquisition unit, a time waveform of a gate voltage during a switching operation of a semiconductor element having an insulated gate;
- store, as a past waveform storage unit, the time waveform of the gate voltage acquired by the gate voltage waveform acquisition unit;
- classify time waveforms of the gate voltage into four types including:
- a normal waveform which is an initial time waveform of the gate voltage,
- an abnormal waveform which is generated immediately after the normal waveform and has a waveform shape different from the normal waveform,
- a transitional waveform which has a waveform shape still unstable after the abnormal waveform, and
- a stable waveform which has a waveform stable shape after the transitional waveform;
- and
- determine, as a state determination unit, a state of an insulating film of the semiconductor element by comparing a past time waveform of the gate voltage stored in the past waveform storage unit and a current time waveform of the gate voltage acquired by the gate voltage waveform acquisition unit.
A state determination device, comprising a processor circuit configured to:
- acquire, as a gate voltage waveform acquisition unit, a time waveform of a gate voltage during a switching operation of a semiconductor element having an insulated gate;
- store, as a past waveform storage unit, a past time waveform of the gate voltage acquired by the gate voltage waveform acquisition unit;
- classify a current time waveform of the gate voltage acquired by the gate voltage waveform acquisition unit into one of four types including:
- a normal waveform which is an initial time waveform of the gate voltage,
- an abnormal waveform which is generated immediately after the normal waveform and has a waveform shape different from the normal waveform,
- a transitional waveform which has a waveform shape still unstable after the abnormal waveform, and
- a stable waveform which has a waveform stable shape after the transitional waveform;
- and
- determine, as a state determination unit, a state of an insulating film of the semiconductor element based on which of the four types the current time waveform is classified as and by comparing the past time waveform of the gate voltage stored in the past waveform storage unit and the current time waveform of the gate voltage acquired by the gate voltage waveform acquisition unit.
Dependencies are inferred from the claim text.