G01R 31/2617
For measuring switching properties thereof
Official title: {for measuring switching properties thereof}
G01R31/2617 (For measuring switching properties thereof) appears on 34 US grants and 38 published applications in this corpus.
Search patents in G01R- Granted patents
- 34
- Published applications
- 38
- Assignees
- 38
- Inventors
- 112
- Latest grant
- 9 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 1 | 2 |
| 2007 | 0 | 1 |
| 2008 | 2 | 0 |
| 2009 | 0 | 0 |
| 2010 | 1 | 1 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 0 |
| 2014 | 1 | 0 |
| 2015 | 0 | 2 |
| 2016 | 0 | 0 |
| 2017 | 1 | 3 |
| 2018 | 2 | 5 |
| 2019 | 1 | 2 |
| 2020 | 2 | 4 |
| 2021 | 7 | 2 |
| 2022 | 3 | 9 |
| 2023 | 3 | 2 |
| 2024 | 6 | 3 |
| 2025 | 2 | 0 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Semiconductor device and overcurrent protection device9 Jun 2026US 12,650,455 B2Fuji Electric Co., Ltd.
- Testing apparatus and testing method13 May 2025US 12,298,340 B2Fuji Electric Co., Ltd.
- Switch short-circuited diagnosis method8 Apr 2025US 12,270,851 B2Delta Electronics, Inc.
- Non-invasive front-end for power electronic monitoring3 Dec 2024US 12,158,490 B2Aalborg Universitet
- Non-invasive online monitoring circuit for on-state saturation voltage of power semiconductor10 Sep 2024US 12,085,600 B1Hunan Lanhai Electrical Engineering Co., Ltd.
- Methods and apparatus to identify a state change of a switch30 Apr 2026US 2026/0118404 A1
- Semiconductor device and overcurrent protection device4 Jul 2024US 2024/0219449 A1Fuji Electric Co., Ltd.
- Testing apparatus and testing method2 May 2024US 2024/0142510 A1Fuji Electric Co., Ltd.
- Switch short-circuited diagnosis method29 Feb 2024US 2024/0069090 A1Delta Electronics, Inc.
- Non-invasive front-end for power electronic monitoring4 May 2023US 2023/0132796 A1Aalborg Universitet
Most cited
By later US patents
- Method and apparatus for evaluating the effects of stress on an RF oscillator7US 7,808,266 B2Texas Instruments Incorporated · 2010
- High-resolution power electronics measurements6US 10,094,863 B2Texas Instruments Incorporated · 2018
- Transistor circuits5US 4,010,418 ARCA Corporation · 1977
- Method for estimating power system health4US 10,605,854 B2Rollys-Royce PLC · 2020
- System and method of monitoring a switching transistor3US 10,895,601 B2Infineon Technologies AG · 2021