Testing apparatus and testing method

A testing apparatus for testing a switching device that is series-coupled to an inductor, and that has a control electrode, a power-source-side electrode, and a ground-side electrode, a predetermined voltage being applied to the inductor, the testing apparatus comprising:

• a variable resistor coupled to the control electrode of the switching device;
• a storage circuit configured to store first information indicating a relation between a resistance value of the variable resistor and a voltage change rate which is a rate at which a voltage between the power-source-side electrode and the ground-side electrode of the switching device changes when the switching device is turned off;
• and
• a control circuit configured to control the variable resistor, and control on and off of the switching device, wherein
• the control circuit is configured to:
• set the resistance value of the variable resistor to a first resistance value and obtain a first value of the voltage change rate,
• set the resistance value of the variable resistor to a second resistance value smaller than the first resistance value based on the first value of voltage change rate and the first information,
• obtain a second value of the voltage change rate measured when the variable resistor is of the second resistance value, and
• determine whether the second value of the voltage change rate meets a first specification of the switching device.