G01R 31/2614
For measuring gain factor thereof
Official title: {for measuring gain factor thereof}
G01R31/2614 (For measuring gain factor thereof) appears on 16 US grants and 4 published applications in this corpus.
Search patents in G01R- Granted patents
- 16
- Published applications
- 4
- Assignees
- 10
- Inventors
- 23
- Latest grant
- 5 Jul 2022
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 0 |
| 2014 | 1 | 1 |
| 2015 | 0 | 0 |
| 2016 | 1 | 0 |
| 2017 | 1 | 0 |
| 2018 | 1 | 1 |
| 2019 | 4 | 0 |
| 2020 | 2 | 0 |
| 2021 | 0 | 0 |
| 2022 | 1 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- IGBT module reliability evaluation method and device based on bonding wire degradation5 Jul 2022US 11,378,613 B2Wuhan University
- Slide screw tuners with offset tuning probes and method16 Jun 2020US 10,686,239 B1
- Slide screw tuners with offset tuning probes and method28 Apr 2020US 10,637,122 B1
- Hybrid harmonic tuner9 Jul 2019US 10,345,370 B1
- Integrated split signal hybrid harmonic tuner22 Jan 2019US 10,187,228 B1
- Igbt module reliability evaluation method and device based on bonding wire degradation6 Jan 2022US 2022/0003807 A1Wuhan University
- Method For Determining A Deterioration Of Power Semiconductor Modules As Well As A Device And Circuit Arrangement18 Jan 2018US 2018/0017612 A1Siemens Aktiengesellschaft
- Insulated gate bipolar transistor failure mode detection and protection system and method18 Dec 2014US 2014/0368232 A1General Electric Company
- Test circuit for bipolar junction transistor20 Dec 2012US 2012/0319720 A1Hon Hai Precision Industry Co., Ltd.
Most cited
By later US patents
- Gamma boosting unit (GBU) for hybrid load and source pull14US 9,331,670 B12016
- In-circuit transistor beta test and method7US 4,801,878 AHewlett-Packard Company · 1989
- Slide screw tuners with offset tuning probes and method6US 10,637,122 B12020
- Slide screw tuners with offset tuning probes and method5US 10,686,239 B12020
- Semiconductor device with monitor pattern, and a method of monitoring device parameters5US 4,364,010 AFujitsu Limited · 1982