System and method for determining probe skew
AssigneeTektronix, Inc.
InventorsVivek Shivaram, Niranjan R Hegde, Shubha B, Krishna N H Sri, Yogesh M. Pai, Venkatraj Melinamane
Life of this patent
Estimating the term…
Abstract
A system for determining an amount of time skew between two measurement probes includes a first probe and a second probe and one or more processors configured to measure a current signal from a Device Under Test (DUT) through the first probe, measure a voltage signal from the DUT through the second probe, generate a modeled voltage signal from the measured current signal, compare the modeled voltage signal to the measured voltage signal, and determine the amount of time skew between the first and the second probe from the compared signals. Methods are also described.
Claims23
A system for determining an amount of time skew between two measurement probes, the system comprising:
- a first probe and a second probe coupled to a Device Under Test (DUT) having at least one semiconductor device;
- and
- one or more processors configured to:
- measure a current signal from the at least one semiconductor device of the DUT through the first probe,
- measure a voltage signal from the at least one semiconductor device of the DUT through the second probe,
- generate a modeled voltage signal from the measured current signal using the following formula:
- V_
-
- (
- ds_low
- )
- =
- V_eb
- -
- 〚
- (
- I
- 〛
-
- _d
- *
- R_probe
- )
- -
- (
- L
- 〛
- eff
- *
- dI
- d
- d
-
- t
- )
- wherein Vds_low is the modeled voltage signal, Veb is a constant bias voltage for the at least one semiconductor device of the DUT, Id is the current signal measured with the first probe, Rprobe is a resistance of the first probe, and Leff is an effective inductance,
- compare the modeled voltage signal to the measured voltage signal,
- determine the amount of time skew between the first and the second probe from the compared signals,
- set a skew value in the system to the determined amount of time skew, and display the skew value.
A method, comprising:
- measuring a current signal of at least one semiconductor device of a Device Under Test (DUT) through the first probe,
- measuring a voltage signal of the at least one semiconductor device of the DUT through the second probe,
- generating a modeled voltage signal from the measured current signal using the following formula:
- V_
-
- (
- ds_low
- )
- =
- V_eb
- -
- 〚
- (
- I
- 〛
-
- _d
- *
- R_probe
- )
- -
- (
- L
- 〛
- eff
- *
- dI
- d
- d
-
- t
- )
- wherein Vds_low is the modeled voltage signal, Veb is a constant bias voltage for the at least one semiconductor device of the DUT, Id is the current signal measured with the first probe, Rprobe is a resistance of the first probe, and Leff is an effective inductance,
- comparing the modeled voltage signal to the measured voltage signal, determining the amount of time skew between the first and the second probe from the compared signals,
- setting a skew value in the system to the determined amount of time skew, and
- displaying the skew value.
Dependencies are inferred from the claim text.